Rajaram; Sanjay

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rajaram; Sanjay.The latest application filed is for "front surface and back surface orientation detection of transparent substrate".

Company Profile

2.10.9

Rajaram; Sanjay - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Substrate processing systems, apparatus, and methods with factory interface environmental controls Grant 11,450,539 - Koshti , et al. September 20, 2	2022-09-20
Substrate processing systems, apparatus, and methods with factory interface environmental controls Grant 11,282,724 - Koshti , et al. March 22, 2	2022-03-22
Front Surface And Back Surface Orientation Detection Of Transparent Substrate App 20210351050 - Wong; Michelle Alejandra ; et al.	2021-11-11
Substrate Processing Systems, Apparatus, And Methods With Factory Interface Environmental Controls App 20190362997 - Koshti; Sushant S. ; et al.	2019-11-28
Substrate processing systems, apparatus, and methods with factory interface environmental controls Grant 10,192,765 - Koshti , et al. Ja	2019-01-29
Substrate Processing Systems, Apparatus, And Methods With Factory Interface Environmental Controls App 20180366355 - Koshti; Sushant S. ; et al.	2018-12-20
Substrate Processing Systems, Apparatus, And Methods With Factory Interface Environmental Controls App 20150045961 - Koshti; Sushant S. ; et al.	2015-02-12
Computer-implemented process control in chemical mechanical polishing Grant 8,460,057 - Swedek , et al. June 11, 2	2013-06-11
Polishing System With In-line And In-situ Metrology App 20110195528 - Swedek; Boguslaw A. ; et al.	2011-08-11
Polishing system with in-line and in-situ metrology Grant 7,927,182 - Swedek , et al. April 19, 2	2011-04-19
Polishing System With In-line And In-situ Metrology App 20100062684 - Swedek; Boguslaw A. ; et al.	2010-03-11
Computer-implemented method for process control in chemical mechanical polishing Grant 7,585,202 - Swedek , et al. September 8, 2	2009-09-08
Polishing System With In-Line and In-Situ Metrology App 20080064300 - Swedek; Boguslaw A. ; et al.	2008-03-13
Polishing system with in-line and in-situ metrology Grant 7,294,039 - Swedek , et al. November 13, 2	2007-11-13
Polishing System With In-Line and In-Situ Metrology App 20060286904 - Swedek; Boguslaw A. ; et al.	2006-12-21
Polishing system with in-line and in-situ metrology Grant 7,101,251 - Swedek , et al. September 5, 2	2006-09-05
Polishing system with in-line and in-situ metrology App 20050245170 - Swedek, Boguslaw A. ; et al.	2005-11-03
Polishing system with in-line and in-situ metrology Grant 6,939,198 - Swedek , et al. September 6, 2	2005-09-06

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