Quli; Farhat

Patent Applications and Registrations

Patent applications and USPTO patent grants for Quli; Farhat.The latest application filed is for "method and system for measuring heat flux".

Company Profile

2.10.7

Quli; Farhat - Union City CA
Quli; Farhat - Hayward CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of fabricating particle size standards on substrates Grant 11,385,187 - Quli , et al. July 12, 2	2022-07-12
Etch-resistant coating on sensor wafers for in-situ measurement Grant 10,720,350 - Nguyen , et al.	2020-07-21
Method and system for measuring heat flux Grant 9,719,867 - Sharratt , et al. August 1, 2	2017-08-01
Film thickness monitor Grant 9,360,302 - Jensen , et al. June 7, 2	2016-06-07
High temperature sensor wafer for in-situ measurements in active plasma Grant 9,222,842 - Sun , et al. December 29, 2	2015-12-29
Process condition measuring device (PCMD) and method for measuring process conditions in a workpiece processing tool configured to process production workpieces Grant 9,134,186 - Sun , et al. September 15, 2	2015-09-15
Method and System for Measuring Heat Flux App 20140355643 - Sharratt; Stephen ; et al.	2014-12-04
High Temperature Sensor Wafer For In-situ Measurements In Active Plasma App 20140192840 - Sun; Mei ; et al.	2014-07-10
Film Thickness Monitor App 20130155390 - Jensen; Earl ; et al.	2013-06-20
Process Condition Measuring Device (pcmd) And Method For Measuring Process Conditions In A Workpiece Processing Tool Configured To Process Production Workpieces App 20120203495 - Sun; Mei ; et al.	2012-08-09
Etch-resistant Coating On Sensor Wafers For In-situ Measurement App 20120074514 - NGUYEN; ANDREW ; et al.	2012-03-29

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.