Quintanilha; Richard

Patent Applications and Registrations

Patent applications and USPTO patent grants for Quintanilha; Richard.The latest application filed is for "inspection tool, inspection method and computer program product".

Company Profile

6.20.21

Quintanilha; Richard - Heidenheim an der Brenz DE
Quintanilha; Richard - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection tool, inspection method and computer program product Grant 11,442,368 - Quintanilha , et al. September 13, 2	2022-09-13
Methods and apparatus for calculating electromagnetic scattering properties of a structure Grant 11,347,151 - Van Kraaij , et al. May 31, 2	2022-05-31
Inspection Tool, Inspection Method And Computer Program Product App 20210232052 - QUINTANILHA; Richard ; et al.	2021-07-29
Optical detector Grant 10,976,265 - Roobol , et al. April 13, 2	2021-04-13
Inspection Apparatus And Inspection Method App 20200348244 - KUMAR; Nitish ; et al.	2020-11-05
Determining edge roughness parameters Grant 10,634,490 - Jak , et al.	2020-04-28
Metrology methods, radiation source, metrology apparatus and device manufacturing method Grant 10,555,407 - Polyakov , et al. Fe	2020-02-04
Methods and Apparatus for Calculating Electromagnetic Scattering Properties of a Structure App 20190346775 - VAN KRAAIJ; Markus Gerardus Martinus Maria ; et al.	2019-11-14
Metrology Methods, Radiation Source, Metrology Apparatus and Device Manufacturing Method App 20190246480 - POLYAKOV; Alexey Olegovich ; et al.	2019-08-08
Metrology methods, radiation source, metrology apparatus and device manufacturing method Grant 10,342,108 - Polyakov , et al.	2019-07-02
Metrology methods, metrology apparatus and device manufacturing method Grant 10,254,644 - Quintanilha , et al.	2019-04-09
Metrology method, metrology apparatus and device manufacturing method Grant 10,222,709 - Quintanilha	2019-03-05
Optical Detector App 20190049393 - ROOBOL; Sander Bas ; et al.	2019-02-14
Determining Edge Roughness Parameters App 20180364036 - JAK; Martin Jacobus Johan ; et al.	2018-12-20
Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method Grant 10,146,140 - Pisarenco , et al. De	2018-12-04
Metrology methods, metrology apparatus and device manufacturing method Grant 10,101,671 - Quintanilha , et al. October 16, 2	2018-10-16
Metrology methods, metrology apparatus and device manufacturing method Grant 10,067,074 - Quintanilha , et al. September 4, 2	2018-09-04
Metrology Methods, Radiation Source, Metrology Apparatus and Device Manufacturing Method App 20180220518 - POLYAKOV; Alexey Olegovich ; et al.	2018-08-02
Inspection apparatus and methods, lithographic system and device manufacturing method Grant 10,036,962 - Quintanilha July 31, 2	2018-07-31
Substrate and patterning device for use in metrology, metrology method and device manufacturing method Grant 9,915,879 - Quintanilha , et al. March 13, 2	2018-03-13
Inspection apparatus and method, lithographic apparatus, lithographic processing cell and device manufacturing method Grant 9,904,181 - Quintanilha February 27, 2	2018-02-27
Metrology Methods, Metrology Apparatus and Device Manufacturing Method App 20170357155 - QUINTANILHA; Richard ; et al.	2017-12-14
Inspection apparatus, inspection method and manufacturing method Grant 9,823,586 - Quintanilha November 21, 2	2017-11-21
Metrology Methods, Metrology Apparatus and Device Manufacturing Method App 20170184981 - QUINTANILHA; Richard ; et al.	2017-06-29
Illumination source for use in inspection methods and/or lithography; inspection and lithographic apparatus and inspection method Grant 9,632,424 - Quintanilha April 25, 2	2017-04-25
Methods and Apparatus for Simulating Interaction of Radiation with Structures, Metrology Methods and Apparatus, Device Manufacturing Method App 20170102623 - PISARENCO; Maxim ; et al.	2017-04-13
Inspection Apparatus, Inspection Method and Manufacturing Method App 20170045823 - QUINTANILHA; Richard	2017-02-16
Lithographic apparatus, substrate and device manufacturing method Grant 9,563,131 - Quintanilha February 7, 2	2017-02-07
Inspection Apparatus and Method, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method App 20160377990 - QUINTANILHA; Richard	2016-12-29
Inspection Apparatus and Methods, Lithographic System and Device Manufacturing Method App 20160320711 - QUINTANILHA; Richard	2016-11-03
Metrology Methods, Metrology Apparatus and Device Manufacturing Method App 20160282282 - QUINTANILHA; Richard ; et al.	2016-09-29
Metrology Method, Metrology Apparatus And Device Manufacturing Method App 20160223476 - QUINTANILHA; Richard	2016-08-04
Lithographic Apparatus, Substrate And Device Manufacturing Method App 20160062247 - QUINTANILHA; Richard	2016-03-03
Lithographic apparatus, substrate and device manufacturing method Grant 9,261,772 - Quintanilha February 16, 2	2016-02-16
Substrate and Patterning Device for Use in Metrology, Metrology Method and Device Manufacturing Method App 20150331336 - QUINTANILHA; Richard ; et al.	2015-11-19
Illumination Source for use in Inspection Methods and/or Lithography; Inspection and Lithographic Apparatus and Inspection Method App 20150042999 - QUINTANILHA; Richard	2015-02-12
Illumination source for use in inspection methods and/or lithography; inspection and lithographic apparatus and inspection method Grant 8,876,346 - Quintanilha November 4, 2	2014-11-04
Lithographic Apparatus, Substrate and Device Manufacturing Method App 20130271740 - QUINTANILHA; Richard	2013-10-17
Illumination Source for use in Inspection Methods and/or Lithography; Inspection and Lithographic Apparatus and Inspection Method App 20130141730 - QUINTANILHA; Richard	2013-06-06

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.