Purrucker; Kerstin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Purrucker; Kerstin.The latest application filed is for "methods and systems for compact, small spot size soft x-ray scatterometry".

Company Profile

3.5.6

Purrucker; Kerstin - Huettenberg DE
Purrucker; Kerstin - Fliederweg DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatterometry App 20220196576 - Wang; David Y. ; et al.	2022-06-23
Methods and systems for measurement of thick films and high aspect ratio structures Grant 11,119,050 - Sapiens , et al. September 14, 2	2021-09-14
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures App 20200284733 - Sapiens; Noam ; et al.	2020-09-10
Methods and systems for measurement of thick films and high aspect ratio structures Grant 10,690,602 - Sapiens , et al.	2020-06-23
Optical metrology with small illumination spot size Grant 10,648,796 - Sapiens , et al.	2020-05-12
Methods And Systems For Measurement Of Thick Films And High Aspect Ratio Structures App 20180238814 - Sapiens; Noam ; et al.	2018-08-23
Optical Metrology With Small Illumination Spot Size App 20180180406 - Sapiens; Noam ; et al.	2018-06-28
Simultaneous multi-angle spectroscopy Grant 9,921,104 - Krishnan , et al. March 20, 2	2018-03-20
Optical metrology with small illumination spot size Grant 9,915,524 - Sapiens , et al. March 13, 2	2018-03-13
Simultaneous Multi-Angle Spectroscopy App 20170356800 - Krishnan; Shankar ; et al.	2017-12-14
Optical Metrology With Small Illumination Spot Size App 20160334326 - Sapiens; Noam ; et al.	2016-11-17

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