PSIA Corporation
Patent Applications and Registrations
Patent applications and USPTO patent grants for PSIA Corporation.The latest application filed is for "apparatus for and method of driving x-y scanner in scanning probe microscope".
- PSIA Corporation -
- PSIA Corporation - Sungnam KR
- PSIA Corporation - Seoul KR
| Patent | Date |
|---|---|
| Apparatus for and method of driving X-Y scanner in scanning probe microscope App 20070012874 - Kim; Joonhui ; et al. | 2007-01-18 |
| Scanning probe microscope with improved probe head mount Grant 6,951,129 - Kwon , et al. October 4, 2 | 2005-10-04 |
| Scanning probe microscope with improved probe tip mount Grant 6,945,100 - Kwon , et al. September 20, 2 | 2005-09-20 |
| Scanning probe microscope with improved probe head mount App 20040140426 - Kwon, Joonhyung ; et al. | 2004-07-22 |
| Scanning probe microscope with improved probe tip mount App 20040140424 - Kwon, Joonhyung ; et al. | 2004-07-22 |
| Scanning probe microscope with improved scan accuracy, scan speed, and optical vision Grant 6,677,567 - Hong , et al. January 13, 2 | 2004-01-13 |
| Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode Grant 6,185,991 - Hong , et al. February 13, 2 | 2001-02-13 |
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