Proksch; Roger

Patent Applications and Registrations

Patent applications and USPTO patent grants for Proksch; Roger.The latest application filed is for "metrological scanning probe microscope".

Company Profile

7.56.62

Proksch; Roger - Santa Barbara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrological scanning probe microscope Grant 10,705,114 - Labuda , et al.	2020-07-07
Thermal measurements using multiple frequency atomic force microscopy Grant 10,556,793 - Proksch , et al. Feb	2020-02-11
Metrological Scanning Probe Microscope App 20190324054 - Labuda; Aleksander ; et al.	2019-10-24
AM/FM measurements using multiple frequency atomic force microscopy Grant 10,444,258 - Proksch , et al. Oc	2019-10-15
Modular atomic force microscope with environmental controls Grant 10,416,190 - Viani , et al. Sept	2019-09-17
Metrological scanning probe microscope Grant 10,338,096 - Labuda , et al.	2019-07-02
Material Property Measurements Using Multiple Frequency Atomic Force Microscopy App 20190195910 - Proksch; Roger ; et al.	2019-06-27
Material property measurements using multiple frequency atomic force microscopy Grant 10,215,773 - Proksch , et al. Feb	2019-02-26
Fully digitally controller for cantilever-based instruments Grant 10,107,832 - Proksch , et al. October 23, 2	2018-10-23
Am/fm Measurements Using Multiple Frequency Atomic Force Microscopy App 20180292432 - Proksch; Roger ; et al.	2018-10-11
Optical beam positioning unit for atomic force microscope Grant 10,054,612 - Labuda , et al. August 21, 2	2018-08-21
Metrological Scanning Probe Microscope App 20180128853 - Labuda; Aleksander ; et al.	2018-05-10
Automated atomic force microscope and the operation thereof Grant 9,921,242 - Proksch , et al. March 20, 2	2018-03-20
AM/FM measurements using multiple frequency of atomic force microscopy Grant 9,841,436 - Proksch , et al. December 12, 2	2017-12-12
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy App 20170313583 - Proksch; Roger ; et al.	2017-11-02
Metrological scanning probe microscope Grant 9,804,193 - Labuda , et al. October 31, 2	2017-10-31
Fully Digitally Controller for Cantilever-Based Instruments App 20170292971 - Proksch; Roger ; et al.	2017-10-12
Modular Atomic Force Microscope App 20170254834 - Proksch; Roger ; et al.	2017-09-07
Fully digitally controller for cantilever-based instruments Grant 9,689,890 - Proksch , et al. June 27, 2	2017-06-27
Modular Atomic Force Microscope with Environmental Controls App 20170168089 - Viani; Mario ; et al.	2017-06-15
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy App 20170131322 - Proksch; Roger ; et al.	2017-05-11
Thermal measurements using multiple frequency atomic force microscopy Grant 9,604,846 - Proksch , et al. March 28, 2	2017-03-28
Modular atomic force microscope with environmental controls Grant 9,581,616 - Viani , et al. February 28, 2	2017-02-28
Integrated micro actuator and LVDT for high precision position measurements Grant 9,518,814 - Proksch , et al. December 13, 2	2016-12-13
Automated Atomic Force Microscope and the Operation Thereof App 20160313369 - Proksch; Roger ; et al.	2016-10-27
Optical Beam Positioning Unit for Atomic Force Microscope App 20160313368 - Labuda; Aleksander ; et al.	2016-10-27
AM/FM measurements using multiple frequency of atomic force microscopy Grant 9,453,857 - Proksch , et al. September 27, 2	2016-09-27
Material Property Measurements Using Multiple Frequency Atomic Force Microscopy App 20160258980 - Proksch; Roger ; et al.	2016-09-08
Optical beam positioning unit for atomic force microscope Grant 9,383,386 - Labuda , et al. July 5, 2	2016-07-05
Automated atomic force microscope and the operation thereof Grant 9,383,388 - Proksch , et al. July 5, 2	2016-07-05
Metrological Scanning Probe Microscope App 20160169937 - Labuda; Aleksander ; et al.	2016-06-16
Modular Atomic Force Microscope with Environmental Controls App 20150338438 - Viani; Mario ; et al.	2015-11-26
AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy App 20150309071 - Proksch; Roger ; et al.	2015-10-29
Automated Atomic Force Microscope and the Operation Thereof App 20150301080 - Proksch; Roger ; et al.	2015-10-22
Modular atomic force microscope with environmental controls Grant 9,097,737 - Viani , et al. August 4, 2	2015-08-04
Nanoindenter Grant 9,063,042 - Bonilla , et al. June 23, 2	2015-06-23
Modular atomic force microscope with environmental controls App 20150150163 - Viani; Mario ; et al.	2015-05-28
Transducer assembly with digitally created signals Grant 9,024,623 - Bocek , et al. May 5, 2	2015-05-05
Fully Digitally Controller for Cantilever-Based Instruments App 20150113687 - Proksch; Roger ; et al.	2015-04-23
Thermal Measurements Using Multiple Frequency Atomic Force Microscopy App 20150013037 - Proksch; Roger ; et al.	2015-01-08
Fully digitally controller for cantilever-based instruments Grant 8,925,376 - Proksch , et al. January 6, 2	2015-01-06
Optical Beam Positioning Unit For Atomic Force Microscope App 20140317790 - Labuda; Aleksander ; et al.	2014-10-23
Modular Atomic Force Microscope App 20140223612 - Proksch; Roger ; et al.	2014-08-07
Active damping of high speed scanning probe microscope components Grant 8,763,475 - Proksch July 1, 2	2014-07-01
Thermal measurements using multiple frequency atomic force microscopy Grant 8,677,809 - Proksch , et al. March 25, 2	2014-03-25
Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy App 20140041084 - Proksch; Roger ; et al.	2014-02-06
Integrated Micro Actuator and LVDT for High Precision Position Measurements App 20130314078 - Proksch; Roger ; et al.	2013-11-28
Material property measurements using multiple frequency atomic fore microscopy Grant 8,555,711 - Proksch , et al. October 15, 2	2013-10-15
Integrated micro actuator and IVDT for high precision position measurements Grant 8,502,525 - Proksch , et al. August 6, 2	2013-08-06
Active Damping of High Speed Scanning Probe Microscope Components App 20130061356 - Proksch; Roger	2013-03-07
Modular atomic force microscope Grant 8,370,960 - Proksch , et al. February 5, 2	2013-02-05
Linear Variable Differential Transformer with Digital Electronics App 20130024162 - Bocek; Dan ; et al.	2013-01-24
Active damping of high speed scanning probe microscope components Grant 8,302,456 - Proksch November 6, 2	2012-11-06
Nanoindenter App 20120272411 - Bonilla; Flavio Alejandro ; et al.	2012-10-25
Fully Digitally Controller for Cantilever-Based Instruments App 20120266336 - Proksch; Roger ; et al.	2012-10-18
Linear variable differential transformer with digital electronics Grant 8,269,485 - Bocek , et al. September 18, 2	2012-09-18
Fully digitally controller for cantilever-based instruments Grant 8,205,488 - Proksch , et al. June 26, 2	2012-06-26
Nanoindenter Grant 8,196,458 - Bonilla , et al. June 12, 2	2012-06-12
Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy App 20120079631 - Proksch; Roger ; et al.	2012-03-29
Apparatus and Method for Isolating and Measuring Movement in Metrology Apparatus App 20120079633 - Proksch; Roger	2012-03-29
Material property measurements using multiple frequency atomic force microscopy Grant 8,024,963 - Proksch , et al. September 27, 2	2011-09-27
Thermal measurements using multiple frequency atomic force microscopy App 20110154546 - Proksch; Roger ; et al.	2011-06-23
Fully digitally controller for cantilever-based instruments Grant 7,937,991 - Proksch , et al. May 10, 2	2011-05-10
Fully Digitally Controller for Cantilever-Based Instruments App 20100333240 - Proksch; Roger ; et al.	2010-12-30
Method for microfabricating a probe with integrated handle, cantilever, tip and circuit Grant 7,861,315 - Proksch , et al. December 28, 2	2010-12-28
Modular atomic force microscope App 20100275334 - Proksch; Roger ; et al.	2010-10-28
Integrated micro actuator and lVDT for high precision position measurements App 20100213930 - Proksch; Roger ; et al.	2010-08-26
Nanoindenter App 20100180356 - Bonilla; Flavio Alejandro ; et al.	2010-07-15
Nanoindenter Grant 7,685,869 - Bonilla , et al. March 30, 2	2010-03-30
Method for microfabricating a probe with integrated handle, cantilever, tip and circuit App 20090178166 - Proksch; Roger ; et al.	2009-07-09
Material property measurements using multiple frequency atomic force microscopy App 20090013770 - Proksch; Roger ; et al.	2009-01-15
Precision position sensor using a nonmagnetic coil form Grant 7,459,904 - Proksch , et al. December 2, 2	2008-12-02
Apparatus for determining cantilever parameters Grant 7,434,445 - Proksch October 14, 2	2008-10-14
Linear force detecting element formed without ferromagnetic materials which produces a resolution in a range of microns or less Grant 7,372,254 - Proksch , et al. May 13, 2	2008-05-13
Fully digitally controller for cantilever-based instruments App 20080011067 - Proksch; Roger ; et al.	2008-01-17
Nanoindenter App 20070227236 - Bonilla; Flavio Alejandro ; et al.	2007-10-04
Active Damping of High Speed Scanning Probe Microscope Components App 20070214864 - Proksch; Roger	2007-09-20
Linear variable differential transformers for high precision position measurements Grant 7,271,582 - Proksch , et al. September 18, 2	2007-09-18
Tactile force and/or position feedback for cantilever-based force measurement instruments Grant 7,266,997 - Proksch , et al. September 11, 2	2007-09-11
Position Sensing Assembly with Synchronizing Capability App 20070200559 - Proksch; Roger ; et al.	2007-08-30
Linear variable differential transformers for high precision position measurements Grant 7,262,592 - Proksch , et al. August 28, 2	2007-08-28
Fully digital controller for cantilever-based instruments Grant 7,234,342 - Proksch , et al. June 26, 2	2007-06-26
Position sensing assembly with sychronizing capability Grant 7,233,140 - Proksch , et al. June 19, 2	2007-06-19
Noncontact Sensitivity and Compliance Calibration Method for Cantilever-Based Instruments App 20070062252 - Proksch; Roger	2007-03-22
Linear variable differential transformers for high precision position measurements App 20060202683 - Proksch; Roger ; et al.	2006-09-14
Linear variable differential transformers for high precision position measurements App 20060192551 - Proksch; Roger ; et al.	2006-08-31
Linear variable differential transformers for high precision position measurements App 20060186876 - Proksch; Roger ; et al.	2006-08-24
Linear variable differential transformers for high precision position measurements App 20060186878 - Proksch; Roger ; et al.	2006-08-24
Linear variable differential transformers for high precision position measurements App 20060186877 - Proksch; Roger ; et al.	2006-08-24
Diffractive optical position detector in an atomic force microscope having a moveable cantilever Grant 7,084,384 - Proksch , et al. August 1, 2	2006-08-01
Noncontact sensitivity and compliance calibration method for cantilever-based insturments Grant 7,066,005 - Proksch June 27, 2	2006-06-27
Linear variable differential transformers for high precision position measurements Grant 7,038,443 - Proksch , et al. May 2, 2	2006-05-02
Diffractive optical position detector App 20060072185 - Proksch; Roger ; et al.	2006-04-06
Diffractive optical position detector Grant 6,884,981 - Proksch , et al. April 26, 2	2005-04-26
Fully digital controller for cantilever-based instruments App 20040206166 - Proksch, Roger ; et al.	2004-10-21
Apparatus and method for isolating and measuring movement in metrology apparatus App 20040079142 - Proksch, Roger	2004-04-29
Linear variable differential transformers for high precision position measurements App 20040075428 - Proksch, Roger ; et al.	2004-04-22
Linear variable differential transformer with digital electronics App 20040056653 - Bocek, Dan ; et al.	2004-03-25
Tactile force and/or position feedback for cantilever-based force measurement instruments App 20040000189 - Proksch, Roger ; et al.	2004-01-01
Apparatus and method for isolating and measuring movement in metrology apparatus App 20030209060 - Proksch, Roger	2003-11-13
Diffractive optical position detector App 20030047675 - Proksch, Roger ; et al.	2003-03-13
Linear variable differential transformers for high precision position measurements App 20020175677 - Proksch, Roger ; et al.	2002-11-28
Noncontact sensitivity and compliance calibration method for cantilever-based instruments App 20020162388 - Proksch, Roger	2002-11-07

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