Price; David W.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Price; David W..The latest application filed is for "imaging reflectometry for inline screening".

Company Profile

3.5.7

Price; David W. - Austin TX
Price; David W. - Cypress TX
Price; David W. - Cheltenham GB2

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Imaging Reflectometry For Inline Screening App 20220307990 - Robinson; John Charles ; et al.	2022-09-29
Systems And Methods For Evaluating The Reliability Of Semiconductor Die Packages App 20220260632 - Rathert; Robert J. ; et al.	2022-08-18
System And Method For Automatically Identifying Defect-based Test Coverage Gaps In Semiconductor Devices App 20220196723 - Price; David W. ; et al.	2022-06-23
Advanced in-line part average testing Grant 11,293,970 - Price , et al. April 5, 2	2022-04-05
System And Method For Identifying Latent Reliability Defects In Semiconductor Devices App 20210239757 - Price; David W. ; et al.	2021-08-05
Advanced In-line Part Average Testing App 20210215753 - Price; David W. ; et al.	2021-07-15
Targeted recall of semiconductor devices based on manufacturing data Grant 10,867,877 - Rathert , et al. December 15, 2	2020-12-15
Methods and systems for inline parts average testing and latent reliability defect detection Grant 10,761,128 - Price , et al. Sep	2020-09-01
Targeted Recall of Semiconductor Devices Based on Manufacturing Data App 20190295908 - Rathert; Robert J. ; et al.	2019-09-26
Methods and Systems for Inline Parts Average Testing and Latent Reliability Defect Detection App 20180275189 - Price; David W. ; et al.	2018-09-27
Molecular scale electronic devices Grant 6,756,605 - Reed , et al. June 29, 2	2004-06-29
Waterproof sheeting Grant 4,458,043 - Evans , et al. July 3, 1	1984-07-03

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