Prevert, Maud
Patent Applications and Registrations
Patent applications and USPTO patent grants for Prevert, Maud.The latest application filed is for "test configuration for a metrological examination of a test object, in particular an integrated circuit".
- Prevert, Maud - Munchen DE
| Patent | Date |
|---|---|
| Test configuration for a metrological examination of a test object, in particular an integrated circuit App 20030103137 - Espertshuber, Klaus ; et al. | 2003-06-05 |
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