Preikszas; Dirk

Patent Applications and Registrations

Patent applications and USPTO patent grants for Preikszas; Dirk.The latest application filed is for "method for operating a particle beam microscope".

Company Profile

8.38.34

Preikszas; Dirk - Oberkochen DE
Preikszas; Dirk - Okerkochen DE
Preikszas; Dirk - Aschaffenburg DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Operating A Particle Beam Microscope App 20220246389 - Preikszas; Dirk ; et al.	2022-08-04
Operating a particle beam generator for a particle beam device Grant 11,380,519 - Preikszas July 5, 2	2022-07-05
Particle beam apparatus having an aperture unit and method for setting a beam current in a particle beam apparatus Grant 11,139,140 - Preikszas , et al. October 5, 2	2021-10-05
Particle-optical apparatus and particle beam system Grant 11,087,949 - Preikszas , et al. August 10, 2	2021-08-10
Particle-optical Apparatus And Particle Beam System App 20200381206 - Preikszas; Dirk ; et al.	2020-12-03
Charged particle beam system and method Grant 10,854,421 - Donhauser , et al. December 1, 2	2020-12-01
Particle-optical apparatus and particle beam system Grant 10,755,889 - Preikszas , et al. A	2020-08-25
Operating a particle beam apparatus Grant 10,699,869 - Preikszas , et al.	2020-06-30
Analyzing energy of charged particles Grant 10,665,423 - Preikszas	2020-05-26
Method for adjusting a particle beam microscope Grant 10,629,404 - Preikszas	2020-04-21
High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatus Grant 10,546,717 - Fichter , et al. Ja	2020-01-28
Operating A Particle Beam Apparatus App 20190318905 - Preikszas; Dirk ; et al.	2019-10-17
Charged Particle Beam System And Method App 20190304743 - Donhauser; Daniela ; et al.	2019-10-03
Method For Adjusting A Particle Beam Microscope App 20190148104 - Preikszas; Dirk	2019-05-16
Particle-optical Apparatus And Particle Beam System App 20180286625 - Preikszas; Dirk ; et al.	2018-10-04
Particle beam microscope and method for operating a particle beam microscope Grant 10,062,542 - Preikszas August 28, 2	2018-08-28
High-voltage Supply Unit And Circuit Arrangement For Generating A High Voltage For A Particle Beam Apparatus App 20180211815 - Fichter; Edgar ; et al.	2018-07-26
High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatus Grant 9,953,804 - Fichter , et al. April 24, 2	2018-04-24
Particle beam apparatus and method for operating a particle beam apparatus Grant 9,947,504 - Hegele , et al. April 17, 2	2018-04-17
Particle beam microscope and method for operating a particle beam microscope Grant 9,859,092 - Preikszas January 2, 2	2018-01-02
Particle Beam Apparatus And Method For Operating A Particle Beam Apparatus App 20170236683 - Hegele; Klaus ; et al.	2017-08-17
Analyzing Energy Of Charged Particles App 20160365221 - Preikszas; Dirk	2016-12-15
High-voltage Supply Unit And Circuit Arrangement For Generating A High Voltage For A Particle Beam Apparatus App 20160314931 - Fichter; Edgar ; et al.	2016-10-27
Particle Beam Microscope And Method For Operating A Particle Beam Microscope App 20160225578 - Preikszas; Dirk	2016-08-04
Particle Beam Microscope And Method For Operating A Particle Beam Microscope App 20160225579 - Preikszas; Dirk	2016-08-04
Particle beam device comprising an electrode unit Grant 9,312,093 - Fober , et al. April 12, 2	2016-04-12
Apparatus for focusing and for storage of ions and for separation of pressure areas App 20160020064 - Laue; Alexander ; et al.	2016-01-21
Printed circuit board multipole for ion focusing Grant 9,230,789 - Laue , et al. January 5, 2	2016-01-05
SACP method and particle optical system for performing the method Grant 9,093,246 - Preikszas July 28, 2	2015-07-28
Charged particle beam column and method of operating same Grant 8,558,190 - Preikszas October 15, 2	2013-10-15
Particle beam microscope Grant 8,476,589 - Benner , et al. July 2, 2	2013-07-02
Device for deflecting or guiding in a particle beam Grant 8,421,028 - Preikszas April 16, 2	2013-04-16
Particle beam device with deflection system Grant 8,405,045 - Preikszas , et al. March 26, 2	2013-03-26
Particle Beam Microscope App 20120326030 - Benner; Gerd ; et al.	2012-12-27
Particle Beam Microscope App 20120326032 - Benner; Gerd ; et al.	2012-12-27
Method And Particle Beam Device For Focusing A Particle Beam App 20120305797 - PREIKSZAS; Dirk	2012-12-06
Scanning charged particle beams Grant 8,304,750 - Preikszas , et al. November 6, 2	2012-11-06
Particle optical arrangement Grant 8,217,350 - Preikszas July 10, 2	2012-07-10
Particle Beam Device With Deflection System App 20120138814 - Preikszas; Dirk ; et al.	2012-06-07
Charged particle beam column and method of operating same Grant 8,129,693 - Preikszas March 6, 2	2012-03-06
Charged Particle Beam Column And Method Of Operating Same App 20120025095 - Preikszas; Dirk	2012-02-02
Particle optical device with magnet assembly Grant 8,063,364 - Preikszas , et al. November 22, 2	2011-11-22
Apparatus for focusing and for storage of ions and for separation of pressure areas App 20110220788 - Laue; Alexander ; et al.	2011-09-15
Particle beam device and method for operation of a particle beam device App 20110215242 - Preikszas; Dirk	2011-09-08
SACP Method and Particle Optical System for Performing the Method App 20110108736 - Preikszas; Dirk	2011-05-12
Electron-beam device and detector system Grant 7,910,887 - Steigerwald , et al. March 22, 2	2011-03-22
Particle beam apparatus having an aperture unit and method for setting a beam current in a particle beam apparatus App 20110049361 - Preikszas; Dirk ; et al.	2011-03-03
Charged Particle Beam Column And Method Of Operating Same App 20100327179 - Preikszas; Dirk	2010-12-30
Scanning Charged Particle Beams App 20100294930 - Preikszas; Dirk ; et al.	2010-11-25
Device For Deflecting Or Guiding In A Particle Beam App 20100258738 - Preikszas; Dirk	2010-10-14
Particle Optical Device With Magnet Assembly App 20100155597 - PREIKSZAS; Dirk ; et al.	2010-06-24
Positioning Device For A Particle Beam Apparatus App 20100044566 - DONITZ; Dietmar ; et al.	2010-02-25
Particle Optical Arrangement App 20090309025 - Preikszas; Dirk	2009-12-17
Electron-beam device and detector system App 20090309024 - STEIGERWALD; MICHAEL D.G. ; et al.	2009-12-17
Control of instruments Grant 7,523,009 - Preikszas , et al. April 21, 2	2009-04-21
Electron-beam device and detector system Grant 7,507,962 - Steigerwald , et al. March 24, 2	2009-03-24
Electron-beam device and detector system Grant 7,425,701 - Steigerwald , et al. September 16, 2	2008-09-16
Electron-beam device and detector system App 20070120071 - Steigerwald; Michael D.G. ; et al.	2007-05-31
Particle-optical arrangements and particle-optical systems Grant 7,022,987 - Preikszas , et al. April 4, 2	2006-04-04
Objective lens for an electron microscopy system and electron microscopy system Grant 6,855,938 - Preikszas , et al. February 15, 2	2005-02-15
Particle beam system having a mirror corrector Grant 6,855,939 - Rose , et al. February 15, 2	2005-02-15
Electron-beam device and detector system App 20040245465 - Steigerwald, Michael D.G. ; et al.	2004-12-09
Objective lens for an electron microscopy system and electron microscopy system App 20040084629 - Preikszas, Dirk ; et al.	2004-05-06
Particle-optical arrangements and particle-optical systems App 20040075053 - Preikszas, Dirk ; et al.	2004-04-22
Particle beam system having a mirror corrector App 20040036031 - Rose, Harald ; et al.	2004-02-26