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Pozzi-Loyola; Scott Patent Filings

Pozzi-Loyola; Scott

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pozzi-Loyola; Scott.The latest application filed is for "system, method and apparatus for macroscopic inspection of reflective specimens".

Company Profile
7.7.6
  • Pozzi-Loyola; Scott - Watsonville CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System, Method And Apparatus For Macroscopic Inspection Of Reflective Specimens
App 20220284549 - Putman; Matthew C. ;   et al.
2022-09-08
Macro inspection systems, apparatus and methods
Grant 11,408,829 - Putman , et al. August 9, 2
2022-08-09
System, method and apparatus for macroscopic inspection of reflective specimens
Grant 11,341,617 - Putman , et al. May 24, 2
2022-05-24
Systems, devices, and methods for combined wafer and photomask inspection
Grant 11,125,677 - Griffith , et al. September 21, 2
2021-09-21
Macro Inspection Systems, Apparatus And Methods
App 20210181121 - Putman; Matthew C. ;   et al.
2021-06-17
System, Method And Apparatus For Macroscopic Inspection Of Reflective Specimens
App 20210166355 - Putman; Matthew C. ;   et al.
2021-06-03
System, Method And Apparatus For Macroscopic Inspection Of Reflective Specimens
App 20210042884 - Putman; Matthew C. ;   et al.
2021-02-11
System, method and apparatus for macroscopic inspection of reflective specimens
Grant 10,915,992 - Putman , et al. February 9, 2
2021-02-09
Macro inspection systems, apparatus and methods
Grant 10,914,686 - Putman , et al. February 9, 2
2021-02-09
Macro Inspection Systems, Apparatus And Methods
App 20200240925 - PUTMAN; MATTHEW C. ;   et al.
2020-07-30
Marco inspection systems, apparatus and methods
Grant 10,545,096 - Putman , et al. Ja
2020-01-28
Systems, Devices, And Methods For Combined Wafer And Photomask Inspection
App 20190257741 - Griffith; Randolph E. ;   et al.
2019-08-22
Systems, devices, and methods for combined wafer and photomask inspection
Grant 10,254,214 - Griffith , et al.
2019-04-09

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