Pomaranski; Ken G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pomaranski; Ken G..The latest application filed is for "computing with both lock-step and free-step processor modes".

Company Profile

0.15.16

Pomaranski; Ken G. - Roseville CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Computing with both lock-step and free-step processor modes Grant 8,826,288 - Barr , et al. September 2, 2	2014-09-02
External state cache for computer processor Grant 8,812,781 - Pomaranski , et al. August 19, 2	2014-08-19
System and method for testing a memory Grant 8,176,250 - Shidla , et al. May 8, 2	2012-05-08
System and method for testing a memory with an expansion card using DMA Grant 7,797,134 - Barr , et al. September 14, 2	2010-09-14
System and method for testing a component in a computer system using frequency margining Grant 7,487,399 - Pomaranski , et al. February 3, 2	2009-02-03
System and method for testing a cell Grant 7,418,367 - Pomaranski , et al. August 26, 2	2008-08-26
System and method for testing a memory using DMA Grant 7,350,109 - Barr , et al. March 25, 2	2008-03-25
Computing with both lock-step and free-step processor modes App 20060245264 - Barr; Andrew H. ; et al.	2006-11-02
Redundant I/O interface management App 20060233204 - Pomaranski; Ken G. ; et al.	2006-10-19
External state cache for computer processor App 20060236034 - Pomaranski; Ken G. ; et al.	2006-10-19
System and method for testing an interconnect in a computer system Grant 7,072,788 - Pomaranski , et al. July 4, 2	2006-07-04
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects Grant 6,995,581 - Barr , et al. February 7, 2	2006-02-07
System and method for testing a component in a computer system using voltage margining Grant 6,985,826 - Pomaranski , et al. January 10, 2	2006-01-10
Apparatus and method for monitoring and predicting failures in system interconnect Grant 6,940,288 - Barr , et al. September 6, 2	2005-09-06
System and method for testing an interconnect in a computer system App 20050125187 - Pomaranski, Ken G. ; et al.	2005-06-09
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects App 20050116733 - Barr, Andrew H. ; et al.	2005-06-02
System and method for testing a memory using DMA App 20050120268 - Barr, Andrew H. ; et al.	2005-06-02
System and method for testing a memory with an expansion card using DMA App 20050107987 - Barr, Andrew H. ; et al.	2005-05-19
Apparatus and method for monitoring high impedance failures in chip interconnects Grant 6,895,353 - Barr , et al. May 17, 2	2005-05-17
System and method for testing a component in a computer system using frequency margining App 20050102655 - Pomaranski, Ken G. ; et al.	2005-05-12
System and method for testing a component in a computer system using voltage margining App 20050096863 - Pomaranski, Ken G. ; et al.	2005-05-05
System and method for testing a cell App 20050096875 - Pomaranski, Ken G. ; et al.	2005-05-05
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects Grant 6,879,173 - Barr , et al. April 12, 2	2005-04-12
System and method for testing a memory App 20050050276 - Shidla, Dale J. ; et al.	2005-03-03
Apparatus and method for monitoring and predicting failures in system interconnect App 20040245996 - Barr, Andrew H. ; et al.	2004-12-09
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects App 20040245981 - Barr, Andrew H. ; et al.	2004-12-09
Apparatus and method for detecting and rejecting high impedance interconnect failures in manufacturing process App 20040246008 - Barr, Andrew H. ; et al.	2004-12-09
Apparatus and method for detecting high impedance failures in system interconnect App 20040249585 - Barr, Andrew H. ; et al.	2004-12-09
Apparatus and method for monitoring high impedance failures in chip interconnects App 20040249612 - Barr, Andrew H. ; et al.	2004-12-09

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