POIS; Heath A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for POIS; Heath A..The latest application filed is for "method and system for monitoring deposition process".

Company Profile

8.12.17

POIS; Heath A. - Fremont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And System For Monitoring Deposition Process App 20220155064 - POIS; Heath A. ; et al.	2022-05-19
Method And System For Non-destructive Metrology Of Thin Layers App 20220074878 - Lee; Wei ; et al.	2022-03-10
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Grant 11,029,148 - Pois , et al. June 8, 2	2021-06-08
Methods and systems for measuring periodic structures using multi-angle x-ray reflectance scatterometry (XRS) Grant 10,859,519 - Pois , et al. December 8, 2	2020-12-08
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20200370885 - Pois; Heath A. ; et al.	2020-11-26
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Grant 10,648,802 - Pois , et al.	2020-05-12
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20200088656 - Pois; Heath A. ; et al.	2020-03-19
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20190360800 - Pois; Heath A. ; et al.	2019-11-28
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) Grant 10,481,112 - Pois , et al. Nov	2019-11-19
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20190086342 - Pois; Heath A. ; et al.	2019-03-21
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20190033069 - Pois; Heath A. ; et al.	2019-01-31
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) Grant 10,119,925 - Pois , et al. November 6, 2	2018-11-06
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Grant 10,082,390 - Pois , et al. September 25, 2	2018-09-25
Method And System For Non-destructive Metrology Of Thin Layers App 20180172609 - LEE; Wei Ti ; et al.	2018-06-21
Silicon germanium thickness and composition determination using combined XPS and XRF technologies Grant 9,952,166 - Pois , et al. April 24, 2	2018-04-24
Silicon Germanium Thickness And Composition Determination Using Combined Xps And Xrf Technologies App 20170176357 - Pois; Heath A. ; et al.	2017-06-22
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20170176354 - Pois; Heath A. ; et al.	2017-06-22
Feed-Forward of Multi-Layer and Multi-Process Information using XPS and XRF Technologies App 20170160081 - Pois; Heath A. ; et al.	2017-06-08
Silicon germanium thickness and composition determination using combined XPS and XRF technologies Grant 9,594,035 - Pois , et al. March 14, 2	2017-03-14
Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) Grant 9,588,066 - Pois , et al. March 7, 2	2017-03-07
Silicon Germanium Thickness And Composition Determination Using Combined Xps And Xrf Technologies App 20150308969 - Pois; Heath A. ; et al.	2015-10-29
Methods And Systems For Measuring Periodic Structures Using Multi-angle X-ray Reflectance Scatterometry (xrs) App 20150204802 - Pois; Heath A. ; et al.	2015-07-23

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