POIS; Heath

Patent Applications and Registrations

Patent applications and USPTO patent grants for POIS; Heath.The latest application filed is for "feed-forward of multi-layer and multi-process information using xps and xrf technologies".

Company Profile

2.5.8

POIS; Heath - Fremont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20210372787 - POIS; Heath ; et al.	2021-12-02
System And Method For Measuring A Sample By X-ray Reflectance Scatterometry App 20210164924 - POIS; Heath ; et al.	2021-06-03
Method And System For Non-destructive Metrology Of Thin Layers App 20200191734 - Lee; Wei Ti ; et al.	2020-06-18
Method and system for non-destructive metrology of thin layers Grant 10,533,961 - Lee , et al. Ja	2020-01-14
Method And System For Non-destructive Metrology Of Thin Layers App 20180328871 - Lee; Wei Ti ; et al.	2018-11-15
High resolution monitoring of CD variations Grant 8,049,903 - Opsal , et al. November 1, 2	2011-11-01
High Resolution Monitoring Of Cd Variations App 20110205554 - OPSAL; Jon ; et al.	2011-08-25
High resolution monitoring of CD variations Grant 7,933,026 - Opsal , et al. April 26, 2	2011-04-26
High Resolution Monitoring Of Cd Variations App 20090259605 - Opsal; Jon ; et al.	2009-10-15
High resolution monitoring of CD variations Grant 7,567,351 - Opsal , et al. July 28, 2	2009-07-28
Multiple tool and structure analysis Grant 7,478,019 - Zangooie , et al. January 13, 2	2009-01-13
High resolution monitoring of CD variations App 20070201017 - Opsal; Jon ; et al.	2007-08-30
Multiple tool and structure analysis App 20060167651 - Zangooie; Shahin ; et al.	2006-07-27

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