loadpatents
name:-0.0061800479888916
name:-0.0059921741485596
name:-0.0022029876708984
Poindexter; Daniel J. Patent Filings

Poindexter; Daniel J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Poindexter; Daniel J..The latest application filed is for "enhancing robustness of soi substrate containing a buried n+ silicon layer for cmos processing".

Company Profile
2.6.5
  • Poindexter; Daniel J. - Cornwall-on-Hudson NY
  • Poindexter; Daniel J. - Cornwell-on-Hudson NY
  • Poindexter; Daniel J. - South Burlington VT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Enhancing robustness of SOI substrate containing a buried N.sup.+ silicon layer for CMOS processing
Grant 10,204,823 - Bedell , et al. Feb
2019-02-12
On-chip sensor for monitoring active circuits on integrated circuit (IC) chips
Grant 10,191,108 - Freeman , et al. Ja
2019-01-29
Enhancing Robustness Of Soi Substrate Containing A Buried N+ Silicon Layer For Cmos Processing
App 20180122688 - Bedell; Stephen W. ;   et al.
2018-05-03
Enhancing robustness of SOI substrate containing a buried N.sup.+ silicon layer for CMOS processing
Grant 9,922,866 - Bedell , et al. March 20, 2
2018-03-20
On-chip Sensor For Monitoring Active Circuits On Integrated Circuit (ic) Chips
App 20170146592 - Freeman; Gregory G. ;   et al.
2017-05-25
Enhancing Robustness Of Soi Substrate Containing A Buried N+ Silicon Layer For Cmos Processing
App 20170033001 - Bedell; Stephen W. ;   et al.
2017-02-02
Method for an efficient modeling of the impact of device-level self-heating on electromigration limited current specifications
Grant 9,552,455 - Poindexter , et al. January 24, 2
2017-01-24
Method for an Efficient Modeling of the Impact of Device-Level Self-Heating on Electromigration Limited Current Specifications
App 20160224717 - Poindexter; Daniel J. ;   et al.
2016-08-04
Low-voltage IC test for defect screening
Grant 9,285,417 - Poindexter , et al. March 15, 2
2016-03-15
Low-voltage Ic Test For Defect Screening
App 20140184262 - Poindexter; Daniel J. ;   et al.
2014-07-03
RF Coupling techniques
Grant 4,512,841 - Cunningham, Jr. , et al. April 23, 1
1985-04-23

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