loadpatents
name:-0.012184143066406
name:-0.0095100402832031
name:-0.0030779838562012
Pittenger; Bede Patent Filings

Pittenger; Bede

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pittenger; Bede.The latest application filed is for "nanoscale dynamic mechanical analysis via atomic force microscopy (afm-ndma)".

Company Profile
2.7.10
  • Pittenger; Bede - Goleta CA
  • Pittenger; Bede - Santa Barbara CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
App 20220252638 - Osechinskiy; Sergey ;   et al.
2022-08-11
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
Grant 11,307,220 - Osechinskiy , et al. April 19, 2
2022-04-19
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
App 20210239732 - Osechinskiy; Sergey ;   et al.
2021-08-05
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
Grant 11,029,330 - Osechinskiy , et al. June 8, 2
2021-06-08
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
App 20200041541 - Osechinskiy; Sergey ;   et al.
2020-02-06
Force Measurement with Real-Time Baseline Determination
App 20180299479 - Liu; Changchun ;   et al.
2018-10-18
Force measurement with real-time baseline determination
Grant 9,910,064 - Liu , et al. March 6, 2
2018-03-06
Force Measurement with Real-Time Baseline Determination
App 20170227577 - Liu; Changchun ;   et al.
2017-08-10
Force measurement with real-time baseline determination
Grant 9,575,090 - Liu , et al. February 21, 2
2017-02-21
Method and Apparatus of Tuning a Scanning Probe Microscope
App 20160109477 - Su; Chanmin ;   et al.
2016-04-21
Method and apparatus of tuning a scanning probe microscope
Grant 9,116,167 - Su , et al. August 25, 2
2015-08-25
Method And Apparatus Of Tuning A Scanning Probe Microscope
App 20150204902 - Su; Chanmin ;   et al.
2015-07-23
Force Measurement with Real-Time Baseline Determination
App 20150160259 - Liu; Changchun ;   et al.
2015-06-11
Method and apparatus of tuning a scanning probe microscope
Grant 8,997,259 - Su , et al. March 31, 2
2015-03-31
Method And Apparatus Of Tuning A Scanning Probe Microscope
App 20130125269 - Su; Chanmin ;   et al.
2013-05-16
Preamplifying cantilever and applications thereof
Grant 7,979,916 - Pittenger , et al. July 12, 2
2011-07-12
Preamplifying Cantilever And Applications Thereof
App 20100017923 - Pittenger; Bede ;   et al.
2010-01-21

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