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name:-0.017349004745483
name:-0.011981010437012
Pisarenco; Maxim Patent Filings

Pisarenco; Maxim

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pisarenco; Maxim.The latest application filed is for "method and apparatus for predicting substrate image".

Company Profile
14.17.22
  • Pisarenco; Maxim - Son en Breugel NL
  • Pisarenco; Maxim - Eindhoven NL
  • Pisarenco; Maxim - Veldhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method
Grant 11,429,763 - Dirks , et al. August 30, 2
2022-08-30
Method for determining contribution to a fingerprint
Grant 11,378,891 - Harutyunyan , et al. July 5, 2
2022-07-05
Method And Apparatus For Predicting Substrate Image
App 20220187713 - MIDDLEBROOKS; Scott Anderson ;   et al.
2022-06-16
Methods and apparatus for calculating electromagnetic scattering properties of a structure
Grant 11,347,151 - Van Kraaij , et al. May 31, 2
2022-05-31
Method For Decision Making In A Semiconductor Manufacturing Process
App 20220082949 - HUBAUX; Arnaud ;   et al.
2022-03-17
Method For Decreasing Uncertainty In Machine Learning Model Predictions
App 20210286270 - MIDDLEBROOKS; Scott Anderson ;   et al.
2021-09-16
Method and apparatus for image analysis
Grant 11,067,901 - Middlebrooks , et al. July 20, 2
2021-07-20
Methods and apparatus for calculating electromagnetic scattering properties of a structure and for reconstruction of approximate structures
Grant 11,041,816 - Pisarenco , et al. June 22, 2
2021-06-22
Hidden Defect Detection And Epe Estimation Based On The Extracted 3d Information From E-beam Images
App 20210174491 - PISARENCO; Maxim ;   et al.
2021-06-10
Scatterometer and Method of Scatterometry Using Acoustic Radiation
App 20210055215 - PISARENCO; Maxim ;   et al.
2021-02-25
Method For Determining Contribution To A Fingerprint
App 20210003927 - Harutyunyan; Davit ;   et al.
2021-01-07
Scatterometer and method of scatterometry using acoustic radiation
Grant 10,845,304 - Pisarenco , et al. November 24, 2
2020-11-24
Method for determining contribution to a fingerprint
Grant 10,816,904 - Harutyunyan , et al. October 27, 2
2020-10-27
Methods and Apparatus for Simulating Interaction of Radiation with Structures, Metrology Methods and Apparatus, Device Manufactu
App 20200202054 - DIRKS; Remco ;   et al.
2020-06-25
Methods and apparatuses for measurement of a parameter of a feature fabricated on a substrate
Grant 10,649,345 - Pisarenco , et al.
2020-05-12
Method and apparatus for image analysis
Grant 10,607,334 - Middlebrooks , et al.
2020-03-31
Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method
Grant 10,592,618 - Dirks , et al.
2020-03-17
Methods and Apparatus for Calculating Electromagnetic Scattering Properties of a Structure
App 20190346775 - VAN KRAAIJ; Markus Gerardus Martinus Maria ;   et al.
2019-11-14
Method for parameter determination and apparatus thereof
Grant 10,444,638 - Pandey , et al. Oc
2019-10-15
Method And Apparatus For Image Analysis
App 20190310554 - MIDDLEBROOKS; Scott Anderson ;   et al.
2019-10-10
Method and apparatus for calculating electromagnetic scattering properties of finite periodic structures
Grant 10,408,753 - Pisarenco , et al. Sept
2019-09-10
Method For Determining Contribution To A Fingerprint
App 20190271919 - HARUTYUNYAN; Davit ;   et al.
2019-09-05
Scatterometer and Method of Scatterometry Using Acoustic Radiation
App 20190113452 - Pisarenco; Maxim ;   et al.
2019-04-18
Method for Parameter Determination and Apparatus Thereof
App 20190033725 - PANDEY; Nitesh ;   et al.
2019-01-31
Methods And Apparatuses For Measurement Of A Parameter Of A Feature Fabricated On A Substrate
App 20190025714 - PISARENCO; Maxim ;   et al.
2019-01-24
Methods and apparatus for simulating interaction of radiation with structures, metrology methods and apparatus, device manufacturing method
Grant 10,146,140 - Pisarenco , et al. De
2018-12-04
Methods and Apparatus for Calculating Electromagnetic Scattering Properties of a Structure and for Reconstruction of Approximate Structures
App 20180164229 - Pisarenco; Maxim ;   et al.
2018-06-14
Methods and apparatus for calculating electromagnetic scattering properties of a structure and for estimation of geometrical and material parameters thereof
Grant 9,939,250 - Pisarenco , et al. April 10, 2
2018-04-10
Method And Apparatus For Image Analysis
App 20170345138 - MIDDLEBROOKS; Scott Anderson ;   et al.
2017-11-30
Methods and Apparatus for Simulating Interaction of Radiation with Structures, Metrology Methods and Apparatus, Device Manufacturing Method
App 20170102623 - PISARENCO; Maxim ;   et al.
2017-04-13
Methods And Apparatus For Simulating Interaction Of Radiation With Structures, Metrology Methods And Apparatus, Device Manufacturing Method
App 20170017738 - DIRKS; Remco ;   et al.
2017-01-19
Methods and Apparatus for Calculating Electromagnetic Scattering Properties of a Structure and for Estimation of Geometrical and Material Parameters thereof
App 20160273906 - PISARENCO; Maxim ;   et al.
2016-09-22
Reference library generation method for methods of inspection, inspection apparatus and lithographic apparatus
Grant 8,875,078 - Pisarenco , et al. October 28, 2
2014-10-28
Method and Apparatus for Calculating Electromagnetic Scattering Properties of Finite Periodic Structures
App 20130144560 - PISARENCO; Maxim ;   et al.
2013-06-06
Reference Library Generation Method for Methods of Inspection, Inspection Apparatus and Lithographic Apparatus
App 20130035911 - PISARENCO; Maxim ;   et al.
2013-02-07

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