Pichon; Michel
Patent Applications and Registrations
Patent applications and USPTO patent grants for Pichon; Michel.The latest application filed is for "device for analyzing visible defects in a transparent substrate".
- Pichon; Michel - Gouvieux N/A FR
- Pichon; Michel - Fontenay-sous-Bois FR
| Patent | Date |
|---|---|
| Device for analysing the surface of a substrate Grant 9,030,554 - Pichon , et al. May 12, 2 | 2015-05-12 |
| Device For Analyzing Visible Defects In A Transparent Substrate App 20140368634 - Pichon; Michel ; et al. | 2014-12-18 |
| Method and device for analyzing the optical quality of a transparent substrate Grant 8,736,688 - Pichon , et al. May 27, 2 | 2014-05-27 |
| Device For Measuring The Shape Of A Mirror Or Of A Specular Surface App 20130162816 - Pichon; Michel ; et al. | 2013-06-27 |
| Method And Device For Analyzing The Optical Quality Of A Transparent Substrate App 20130010175 - Pichon; Michel ; et al. | 2013-01-10 |
| Device For Analysing The Surface Of A Substrate App 20110187855 - Pichon; Michel ; et al. | 2011-08-04 |
| Method and apparatus for measuring percent error of an impedance Grant 4,068,166 - Pichon January 10, 1 | 1978-01-10 |
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