Pfaff; Paul
Patent Applications and Registrations
Patent applications and USPTO patent grants for Pfaff; Paul.The latest application filed is for "condition assessment system for a structure including a semiconductor material".
- Pfaff; Paul - Lake Oswego OR
- Pfaff; Paul - Portland OR
| Patent | Date |
|---|---|
| Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material Grant 7,773,230 - Pfaff August 10, 2 | 2010-08-10 |
| Condition Assessment System For A Structure Including A Semiconductor Material App 20090002717 - Pfaff; Paul | 2009-01-01 |
| Method For Optically Testing Semiconductor Devices App 20080252898 - Pfaff; Paul | 2008-10-16 |
| Method for optically testing semiconductor devices Grant 7,400,411 - Pfaff July 15, 2 | 2008-07-15 |
| Voltage testing and measurement Grant 7,323,889 - Pfaff , et al. January 29, 2 | 2008-01-29 |
| Non-destructive testing system using a laser beam Grant 7,206,078 - Pfaff , et al. April 17, 2 | 2007-04-17 |
| Voltage testing and measurement Grant 6,972,577 - Pfaff , et al. December 6, 2 | 2005-12-06 |
| Non-destructive testing system App 20050231733 - Pfaff, Paul ; et al. | 2005-10-20 |
| Voltage testing and measurement App 20050156609 - Pfaff, Paul ; et al. | 2005-07-21 |
| Voltage testing and measurement Grant 6,803,777 - Pfaff , et al. October 12, 2 | 2004-10-12 |
| Voltage testing and measurement App 20040046577 - Pfaff, Paul ; et al. | 2004-03-11 |
| Voltage testing and measurement App 20030067312 - Pfaff, Paul ; et al. | 2003-04-10 |
| Voltage testing and measurement App 20030057972 - Pfaff, Paul ; et al. | 2003-03-27 |
| Method for testing a device under test including the interference of two beams Grant 6,512,385 - Pfaff , et al. January 28, 2 | 2003-01-28 |
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