Peterson; Brennan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Peterson; Brennan.The latest application filed is for "process window based on defect probability".

Company Profile

7.13.16

Peterson; Brennan - Longmont CO
Peterson; Brennan - Veldhoven NL
Peterson; Brennan - Portland OR
Peterson; Brennan - Veldhoeven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for controlling a manufacturing process and associated apparatuses Grant 11,187,994 - Kamali , et al. November 30, 2	2021-11-30
Process Window Based On Defect Probability App 20210356874 - SLACHTER; Abraham ; et al.	2021-11-18
Method of manufacturing devices Grant 11,087,065 - Mahajan , et al. August 10, 2	2021-08-10
Process window based on defect probability Grant 11,079,687 - Slachter , et al. August 3, 2	2021-08-03
Voltage Contrast Metrology Mark App 20210088917 - TABERY; Cyrus Emil ; et al.	2021-03-25
Information determining apparatus and method Grant 10,948,837 - Gao , et al. March 16, 2	2021-03-16
Process Window Based On Defect Probability App 20210018850 - SLACHTER; Abraham ; et al.	2021-01-21
Metallic gratings and measurement methods thereof Grant 10,883,924 - O' Mullane , et al. January 5, 2	2021-01-05
Information Determining Apparatus And Method App 20200159134 - GAO; An ; et al.	2020-05-21
Clearing Out Method, Revealing Device, Lithographic Apparatus, And Device Manufacturing Method App 20200152527 - JEUNINK; Andre Bernardus ; et al.	2020-05-14
Method Of Manufacturing Devices App 20200097633 - MAHAJAN; Sunit Sondhi ; et al.	2020-03-26
Metrology Apparatus and Method for Determining a Characteristic of One or More Structures on a Substrate App 20190378012 - Tripodi; Lorenzo ; et al.	2019-12-12
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella Grant 10,283,317 - Keady , et al.	2019-05-07
Via characterization for BCD and depth metrology Grant 10,254,110 - Xiao , et al.	2019-04-09
High Throughput Tem Preparation Processes And Hardware For Backside Thinning Of Cross-sectional View Lamella App 20170250055 - Keady; Paul ; et al.	2017-08-31
High throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella Grant 9,653,260 - Keady , et al. May 16, 2	2017-05-16
Metallic Gratings And Measurement Methods Thereof App 20160069792 - O'Mullane; Sam ; et al.	2016-03-10
Measurement and endpointing of sample thickness Grant 9,184,025 - Young , et al. November 10, 2	2015-11-10
Via Characterization For Bcd And Depth Metrology App 20150168128 - XIAO; Ke ; et al.	2015-06-18
High Throughput TEM Preparation Processes and Hardware for Backside Thinning of Cross-Sectional View Lamella App 20130248354 - Keady; Paul ; et al.	2013-09-26
Measurement And Endpointing Of Sample Thickness App 20120187285 - YOUNG; RICHARD J. ; et al.	2012-07-26
Measurement and endpointing of sample thickness Grant 8,170,832 - Young , et al. May 1, 2	2012-05-01
Barrier formation and structure to use in semiconductor devices Grant 7,768,126 - Fischer , et al. August 3, 2	2010-08-03
Measurement And Endpointing Of Sample Thickness App 20100116977 - Young; Richard J. ; et al.	2010-05-13
Barrier process/structure for transistor trench contact applications App 20090170309 - Chikarmane; Vinay ; et al.	2009-07-02
Barrier process/structure for transistor trench contact applications Grant 7,525,197 - Chikarmane , et al. April 28, 2	2009-04-28
Barrier formation and structure to use in semiconductor devices App 20080079165 - Fischer; Kevin ; et al.	2008-04-03
Barrier process/structure for transistor trench contact applications App 20080026556 - Chikarmane; Vinay ; et al.	2008-01-31

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.