Perng; Ming-Hwei
Patent Applications and Registrations
Patent applications and USPTO patent grants for Perng; Ming-Hwei.The latest application filed is for "method for thickness calibration and measuring thickness of material".
- Perng; Ming-Hwei - Hsinchu TW
- PERNG; Ming-Hwei - Hsinchu City TW
| Patent | Date |
|---|---|
| Automatic search system and method Grant 8,712,625 - Tsai , et al. April 29, 2 | 2014-04-29 |
| Method for thickness calibration and measuring thickness of material Grant 8,077,827 - Perng December 13, 2 | 2011-12-13 |
| Method For Thickness Calibration And Measuring Thickness Of Material App 20110206182 - PERNG; Ming-Hwei | 2011-08-25 |
| Detection Method And Detection System Of Moving Object App 20110085026 - PERNG; Ming-Hwei ; et al. | 2011-04-14 |
| Method For Determining Ego-motion Of Moving Platform And Detection System App 20110074927 - Perng; Ming-Hwei ; et al. | 2011-03-31 |
| Automatic Search System And Method App 20110046838 - Tsai; Hung-Yin ; et al. | 2011-02-24 |
| Q-space sampling method and diffusion spectrum imaging method employing the same Grant 7,495,440 - Chiang , et al. February 24, 2 | 2009-02-24 |
| Q-space Sampling Method And Diffusion Spectrum Imaging Method Employing The Same App 20080272781 - CHIANG; Wen-Yang ; et al. | 2008-11-06 |
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