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Device for measuring a component of current based on magnetic fields Grant 7,408,342 - Desplats , et al. August 5, 2 | 2008-08-05 |
Apparatus and method for detecting photon emissions from transistors Grant 7,400,154 - Desplats , et al. July 15, 2 | 2008-07-15 |
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Method for customizing an integrated circuit element Grant 7,190,822 - Desplats , et al. March 13, 2 | 2007-03-13 |
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Apparatus And Method For Detecting Photon Emissions From Transistors App 20060181268 - Desplats; Romain ;   et al. | 2006-08-17 |
Apparatus and method for detecting photon emissions from transistors App 20060108997 - Desplats; Romain ;   et al. | 2006-05-25 |
Apparatus and method for detecting photon emissions from transistors Grant 7,038,442 - Desplats , et al. May 2, 2 | 2006-05-02 |
Spatial and temporal selective laser assisted fault localization Grant 6,967,491 - Perdu , et al. November 22, 2 | 2005-11-22 |
Apparatus and method for detecting photon emissions from transistors App 20050231219 - Desplats, Romain ;   et al. | 2005-10-20 |
Method and installation for fast fault localization in an integrated circuit Grant 6,948,107 - Desplats , et al. September 20, 2 | 2005-09-20 |
Apparatus and method for detecting photon emissions from transistors Grant 6,943,572 - Desplats , et al. September 13, 2 | 2005-09-13 |
Apparatus and method for detecting photon emissions from transistors App 20050146321 - Desplats, Romain ;   et al. | 2005-07-07 |
Apparatus and method for detecting photon emissions from transistors Grant 6,891,363 - Desplats , et al. May 10, 2 | 2005-05-10 |
Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization App 20050024057 - Desplats, Romain ;   et al. | 2005-02-03 |
Spatial and temporal selective laser assisted fault localization App 20050006602 - Perdu, Philippe ;   et al. | 2005-01-13 |
Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip Grant 6,816,614 - Desplats , et al. November 9, 2 | 2004-11-09 |
Apparatus and method for detecting photon emissions from transistors App 20040189335 - Desplats, Romain ;   et al. | 2004-09-30 |
Apparatus and method for detecting photon emissions from transistors App 20040041575 - Desplats, Romain ;   et al. | 2004-03-04 |
Method for customizing an integrated circuit element App 20030174171 - Desplats, Romain ;   et al. | 2003-09-18 |