PERDU; Philippe

Patent Applications and Registrations

Patent applications and USPTO patent grants for PERDU; Philippe.The latest application filed is for "method and device for reconstructing a useful signal from a noisy acquired signal".

Company Profile

0.13.15

PERDU; Philippe - TOULOUSE FR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method And Device For Reconstructing A Useful Signal From A Noisy Acquired Signal App 20180336162 - BOSCARO; Anthony ; et al.	2018-11-22
Method of characterizing an electrical defect affecting an electronic circuit, related device and information recording medium App 20120116734 - INFANTE; Fulvio ; et al.	2012-05-10
Method And Machine For Multidimensional Testing Of An Electronic Device On The Basis Of A Monodirectional Probe App 20110187352 - Perdu; Philippe	2011-08-04
Apparatus and method for detecting photon emissions from transistors Grant 7,439,730 - Desplats , et al. October 21, 2	2008-10-21
Magnetic-field-measuring device Grant 7,417,424 - Desplats , et al. August 26, 2	2008-08-26
Magnetic-field-measuring probe Grant 7,411,391 - Desplats , et al. August 12, 2	2008-08-12
Device for measuring a component of current based on magnetic fields Grant 7,408,342 - Desplats , et al. August 5, 2	2008-08-05
Apparatus and method for detecting photon emissions from transistors Grant 7,400,154 - Desplats , et al. July 15, 2	2008-07-15
Apparatus and method for detecting photon emissions from transistors Grant 7,323,862 - Desplats , et al. January 29, 2	2008-01-29
Magnetic-field-measuring probe App 20070132464 - Desplats; Romain ; et al.	2007-06-14
Magnetic-field-measuring probe App 20070108975 - Desplats; Romain ; et al.	2007-05-17
Method for customizing an integrated circuit element Grant 7,190,822 - Desplats , et al. March 13, 2	2007-03-13
Magnetic-field-measuring device App 20070052412 - Desplats; Romain ; et al.	2007-03-08
Apparatus And Method For Detecting Photon Emissions From Transistors App 20060181268 - Desplats; Romain ; et al.	2006-08-17
Apparatus and method for detecting photon emissions from transistors App 20060108997 - Desplats; Romain ; et al.	2006-05-25
Apparatus and method for detecting photon emissions from transistors Grant 7,038,442 - Desplats , et al. May 2, 2	2006-05-02
Spatial and temporal selective laser assisted fault localization Grant 6,967,491 - Perdu , et al. November 22, 2	2005-11-22
Apparatus and method for detecting photon emissions from transistors App 20050231219 - Desplats, Romain ; et al.	2005-10-20
Method and installation for fast fault localization in an integrated circuit Grant 6,948,107 - Desplats , et al. September 20, 2	2005-09-20
Apparatus and method for detecting photon emissions from transistors Grant 6,943,572 - Desplats , et al. September 13, 2	2005-09-13
Apparatus and method for detecting photon emissions from transistors App 20050146321 - Desplats, Romain ; et al.	2005-07-07
Apparatus and method for detecting photon emissions from transistors Grant 6,891,363 - Desplats , et al. May 10, 2	2005-05-10
Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization App 20050024057 - Desplats, Romain ; et al.	2005-02-03
Spatial and temporal selective laser assisted fault localization App 20050006602 - Perdu, Philippe ; et al.	2005-01-13
Method for comparing recorded pixel images representing equipotential lines of at least an integrated circuit chip Grant 6,816,614 - Desplats , et al. November 9, 2	2004-11-09
Apparatus and method for detecting photon emissions from transistors App 20040189335 - Desplats, Romain ; et al.	2004-09-30
Apparatus and method for detecting photon emissions from transistors App 20040041575 - Desplats, Romain ; et al.	2004-03-04
Method for customizing an integrated circuit element App 20030174171 - Desplats, Romain ; et al.	2003-09-18

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