Peng; Yue-Lin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Peng; Yue-Lin.The latest application filed is for "mini identification mark".

Company Profile

4.5.5

Peng; Yue-Lin - Taoyuan TW
Peng; Yue-Lin - Taoyuan City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods for selectively forming identification mark on semiconductor wafer Grant 11,121,093 - Peng , et al. September 14, 2	2021-09-14
Mini identification mark in die-less region of semiconductor wafer Grant 10,643,951 - Peng , et al.	2020-05-05
Mini Identification Mark App 20200013726 - Peng; Yue-Lin ; et al.	2020-01-09
Metrology method and apparatus, computer program and lithographic system Grant 10,261,427 - Zeng , et al.	2019-04-16
Mini Identification Mark App 20190019760 - Peng; Yue-Lin ; et al.	2019-01-17
Metrology Method And Apparatus, Computer Program And Lithographic System App 20180136570 - ZENG; Si-Han ; et al.	2018-05-17
Metrology method and apparatus, computer program and lithographic system Grant 9,879,988 - Liu , et al. January 30, 2	2018-01-30
Metrology method and apparatus, computer program and lithographic system Grant 9,869,940 - Zeng , et al. January 16, 2	2018-01-16
Metrology Method and Apparatus, Computer Program and Lithographic System App 20160313654 - ZENG; Si-Han ; et al.	2016-10-27
Metrology Method and Apparatus, Computer Program and Lithographic System App 20160223322 - LIU; Xing Lan ; et al.	2016-08-04

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