PELED; Einat
Patent Applications and Registrations
Patent applications and USPTO patent grants for PELED; Einat.The latest application filed is for "fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing".
- PELED; Einat - Pardes Hanna-Karkur IL
- Peled; Einat - Haifa IL
| Patent | Date |
|---|---|
| Fab Management With Dynamic Sampling Plans, Optimized Wafer Measurement Paths And Optimized Wafer Transport, Using Quantum Computing App 20210335638 - MANASSEN; Amnon ; et al. | 2021-10-28 |
| Overlay measurement using multiple wavelengths Grant 11,158,548 - Lamhot , et al. October 26, 2 | 2021-10-26 |
| Overlay Measurement Using Multiple Wavelengths App 20200381312 - Lamhot; Yuval ; et al. | 2020-12-03 |
| Quick adjustment of metrology measurement parameters according to process variation Grant 10,699,969 - Peled , et al. | 2020-06-30 |
| Target location in semiconductor manufacturing Grant 10,504,802 - Ittah , et al. Dec | 2019-12-10 |
| Quick Adjustment Of Metrology Measurement Parameters According To Process Variation App 20190074227 - Peled; Einat ; et al. | 2019-03-07 |
| Target Location in Semiconductor Manufacturing App 20180301385 - Ittah; Naomi ; et al. | 2018-10-18 |
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