PEAK; JONG-SUN
Patent Applications and Registrations
Patent applications and USPTO patent grants for PEAK; JONG-SUN.The latest application filed is for "multi-analysis algorithm using signal sharing and related apparatus".
- PEAK; JONG-SUN - HWASEONG-SI KR
- Peak; Jong-Sun - Seongnam-si KR
- Peak; Jong-Sun - Gyeonggi-do KR
- Peak; Jong-Sun - Guri-si KR
| Patent | Date |
|---|---|
| Multi-analysis Algorithm Using Signal Sharing And Related Apparatus App 20150219440 - KIM; YOUNG-SEOK ; et al. | 2015-08-06 |
| Method of aligning a substrate Grant 8,730,475 - Kim , et al. May 20, 2 | 2014-05-20 |
| Apparatus and method for measuring semiconductor device Grant 8,324,571 - Kim , et al. December 4, 2 | 2012-12-04 |
| Method of aligning a substrate Grant 8,134,709 - Peak , et al. March 13, 2 | 2012-03-13 |
| Method of Aligning a Substrate App 20120008144 - Kim; Young-Seok ; et al. | 2012-01-12 |
| Apparatus And Method For Measuring Semiconductor Device App 20100219340 - KIM; Young-Seok ; et al. | 2010-09-02 |
| Method Of Aligning A Substrate App 20090147259 - Peak; Jong-Sun ; et al. | 2009-06-11 |
| Method for recognizing a pattern of an alignment mark on a wafer Grant 7,379,581 - Peak May 27, 2 | 2008-05-27 |
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