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Patent applications and USPTO patent grants for PDF Solutions.The latest application filed is for "systems and methods for electrical characterization of inter-layer alignment".
Patent | Date |
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Test structures and methods for measuring silicon thickness in fully depleted silicon-on-insulator technologies Grant 9,691,669 - Saxena , et al. June 27, 2 | 2017-06-27 |
Systems and methods for detecting and monitoring nickel-silicide process and induced failures Grant 7,932,105 - Saxena , et al. April 26, 2 | 2011-04-26 |
Generalization of the photo process window and its application to OPC test pattern design Grant 7,568,180 - Eisenmann , et al. July 28, 2 | 2009-07-28 |
Systems And Methods For Electrical Characterization Of Inter-layer Alignment App 20090033353 - Yu; Kaung Shia ;   et al. | 2009-02-05 |
Oxide-Nitride-Oxide spacer with oxide layers free of nitridization App 20050040479 - Koldiaev, Viktor ;   et al. | 2005-02-24 |
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