PAWLOWICZ; Christopher

Patent Applications and Registrations

Patent applications and USPTO patent grants for PAWLOWICZ; Christopher.The latest application filed is for "ion beam delayering system and method, and endpoint monitoring system and method therefor".

Company Profile

5.7.9

PAWLOWICZ; Christopher - Ontario CA
PAWLOWICZ; Christopher - Ottawa CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ion Beam Delayering System And Method, And Endpoint Monitoring System And Method Therefor App 20220122805 - PAWLOWICZ; Christopher	2022-04-21
Ion Beam Delayering System And Method, Topographically Enhanced Delayered Sample Produced Thereby, And Imaging Methods And Systems Related Thereto App 20220005669 - PAWLOWICZ; Christopher ; et al.	2022-01-06
Method and system for ion beam delayering of a sample and control thereof Grant 11,214,874 - Foster , et al. January 4, 2	2022-01-04
Method And System For Ion Beam Delayering Of A Sample And Control Thereof App 20200318242 - Foster; Robert K. ; et al.	2020-10-08
Method and system for ion beam delayering of a sample and control thereof Grant 10,689,763 - Foster , et al.	2020-06-23
Method and system for ion beam delayering of a sample and control thereof Grant 10,550,480 - Foster , et al. Fe	2020-02-04
Methods, systems and devices relating to distortion correction in imaging devices Grant 10,469,777 - Pawlowicz , et al. No	2019-11-05
Circuit tracing using a focused ion beam Grant 9,915,628 - Pawlowicz , et al. March 13, 2	2018-03-13
Methods, Systems And Devices Relating To Distortion Correction In Imaging Devices App 20180054575 - PAWLOWICZ; Christopher ; et al.	2018-02-22
Method And System For Ion Beam Delayering Of A Sample And Control Thereof App 20170096741 - Foster; Robert K. ; et al.	2017-04-06
Method And System For Ion Beam Delayering Of A Sample And Control Thereof App 20170089813 - Foster; Robert K. ; et al.	2017-03-30
Method and system for ion beam delayering of a sample and control thereof Grant 9,534,299 - Foster , et al. January 3, 2	2017-01-03
Circuit tracing using a focused ion beam Grant 9,529,040 - Pawlowicz , et al. December 27, 2	2016-12-27
Circuit Tracing Using A Focused Ion Beam App 20160282287 - PAWLOWICZ; Christopher ; et al.	2016-09-29
Circuit Tracing Using A Focused Ion Beam App 20160187419 - PAWLOWICZ; Christopher ; et al.	2016-06-30
Method And System For Ion Beam Delayering Of A Sample And Control Thereof App 20130118896 - Foster; Robert K. ; et al.	2013-05-16

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