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name:-0.0058178901672363
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Pavia; Giuseppe Patent Filings

Pavia; Giuseppe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pavia; Giuseppe.The latest application filed is for "method for operating a particle beam generator for a particle beam device and particle beam device comprising a particle beam ge".

Company Profile
2.4.8
  • Pavia; Giuseppe - Aalen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charged particle beam system and method
Grant 10,854,421 - Donhauser , et al. December 1, 2
2020-12-01
Method for operating a particle beam generator for a particle beam device and particle beam device comprising a particle beam generator
Grant 10,763,076 - Pavia Sep
2020-09-01
Method For Operating A Particle Beam Generator For A Particle Beam Device And Particle Beam Device Comprising A Particle Beam Ge
App 20190355551 - Pavia; Giuseppe
2019-11-21
Method of generating a zoom sequence and microscope system configured to perform the method
Grant 10,468,229 - Pavia No
2019-11-05
Charged Particle Beam System And Method
App 20190304743 - Donhauser; Daniela ;   et al.
2019-10-03
Method of determining crystallographic properties of a sample and electron beam microscope for performing the method
Grant 10,319,560 - Pavia
2019-06-11
Method Of Determining Crystallographic Properties Of A Sample And Electron Beam Microscope For Performing The Method
App 20170025249 - Pavia; Giuseppe
2017-01-26
Method Of Generating A Zoom Sequence And Microscope System Configured To Perform The Method
App 20160284507 - Pavia; Giuseppe
2016-09-29
Method For Preparing And Analyzing An Object As Well As Particle Beam Device For Performing The Method
App 20150214004 - Pavia; Giuseppe
2015-07-30
Method For Setting An Operating Parameter Of A Particle Beam Device And A Sample Holder For Performing The Method
App 20130234011 - Niebel; Harald ;   et al.
2013-09-12
Method for setting an operating parameter of a particle beam device and a sample holder for performing the method
App 20100230584 - Niebel; Harald ;   et al.
2010-09-16

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