loadpatents
name:-0.004021167755127
name:-0.008253812789917
name:-0.00041699409484863
Pauschinger; Dieter Patent Filings

Pauschinger; Dieter

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pauschinger; Dieter.The latest application filed is for "reflective x-ray microscope and inspection system for examining objects with wavelengths < 100 nm".

Company Profile
0.7.3
  • Pauschinger; Dieter - Berlin DE
  • Pauschinger; Dieter - Hohen Neuendorf DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity

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