Pastel; Leah M. P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pastel; Leah M. P..The latest application filed is for "method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage".

Company Profile

0.21.20

Pastel; Leah M. P. - Essex VT US
Pastel; Leah M. P. - Essex Junction VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Bit failure signature identification Grant 8,451,018 - Furland , et al. May 28, 2	2013-05-28
Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage Grant 8,347,260 - Bernstein , et al. January 1, 2	2013-01-01
Method Of Designing An Integrated Circuit Based On A Combination Of Manufacturability, Test Coverage And, Optionally, Diagnostic Coverage App 20120066657 - Bernstein; Kerry ; et al.	2012-03-15
Random personalization of chips during fabrication Grant 8,015,514 - Jaffe , et al. September 6, 2	2011-09-06
Bit Failure Signature Identification App 20110199114 - Furland; Thomas D. ; et al.	2011-08-18
Random Personalization Of Chips During Fabrication App 20100164013 - Jaffe; Mark D. ; et al.	2010-07-01
Integrated carbon nanotube sensors Grant 7,484,423 - Hakey , et al. February 3, 2	2009-02-03
Testing Using Independently Controllable Voltage Islands App 20080284459 - Gattiker; Anne E. ; et al.	2008-11-20
Testing using independently controllable voltage islands Grant 7,428,675 - Gattiker , et al. September 23, 2	2008-09-23
Hot Switchable Voltage Bus for Iddq Current Measurements App 20080129324 - Pastel; Leah M. P.	2008-06-05
Integrated Carbon Nanotube Sensors App 20070197010 - Hakey; Mark C. ; et al.	2007-08-23
Integrated carbon nanotube sensors Grant 7,247,877 - Hakey , et al. July 24, 2	2007-07-24
Utilizing clock shield as defect monitor Grant 7,239,167 - Cohn , et al. July 3, 2	2007-07-03
Utilizing Clock Shield As Defect Monitor App 20070108964 - Cohn; JohnM ; et al.	2007-05-17
Sensor differentiated fault isolation Grant 7,202,689 - Condon , et al. April 10, 2	2007-04-10
Designing scan chains with specific parameter sensitivities to identify process defects Grant 7,194,706 - Adkisson , et al. March 20, 2	2007-03-20
Segmented scan chains with dynamic reconfigurations Grant 7,139,950 - Huisman , et al. November 21, 2	2006-11-21
Method for designing an integrated circuit defect monitor Grant 7,093,213 - Cohn , et al. August 15, 2	2006-08-15
Utilizing clock shield as defect monitor Grant 7,088,124 - Cohn , et al. August 8, 2	2006-08-08
Canary device for failure analysis Grant 7,089,138 - Bouchard , et al. August 8, 2	2006-08-08
Defect diagnosis for semiconductor integrated circuits Grant 7,089,514 - Adkisson , et al. August 8, 2	2006-08-08
Testing using independently controllable voltage islands App 20060158222 - Gattiker; Anne ; et al.	2006-07-20
Method for locating I.sub.DDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester Grant 7,064,570 - Buffet , et al. June 20, 2	2006-06-20
Utilizing clock shield as defect monitor App 20060066342 - Cohn; John M. ; et al.	2006-03-30
Utilizing clock shield as defect monitor Grant 7,005,874 - Cohn , et al. February 28, 2	2006-02-28
Integrated Carbon Nanotube Sensors App 20060038167 - Hakey; Mark C. ; et al.	2006-02-23
Method For Designing An Integrated Circuit Defect Monitor App 20060036976 - Cohn; John M. ; et al.	2006-02-16
Defect Diagnosis For Semiconductor Integrated Circuits App 20060036975 - Adkisson; James W. ; et al.	2006-02-16
Circuit and method for monitoring defects Grant 6,998,866 - Bazan , et al. February 14, 2	2006-02-14
Designing Scan Chains With Specific Parameter Sensitivities to Identify Process Defects App 20060026472 - Adkisson; James W. ; et al.	2006-02-02
Circuit And Method For Monitoring Defects App 20060022693 - Bazan; Greg ; et al.	2006-02-02
Utilizing Clock Shield As Defect Monitor App 20050285611 - Cohn, John M. ; et al.	2005-12-29
Segmented Scan Chains With Dynamic Reconfigurations App 20050166108 - Huisman, Leendert M. ; et al.	2005-07-28
Method to detect systematic defects in VLSI manufacturing Grant 6,880,136 - Huisman , et al. April 12, 2	2005-04-12
Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester App 20040061519 - Buffet, Patrick H. ; et al.	2004-04-01
Method to detect systematic defects in VLSI manufacturing App 20040009616 - Huisman, Leendert M. ; et al.	2004-01-15
Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester Grant 6,677,774 - Buffet , et al. January 13, 2	2004-01-13
Incremental fault dictionary Grant 6,675,323 - Bartenstein , et al. January 6, 2	2004-01-06
Incremental fault dictionary App 20030046608 - Bartenstein, Thomas W. ; et al.	2003-03-06
Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester App 20020196042 - Buffet, Patrick H. ; et al.	2002-12-26

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.