Pastel; Leah M.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Pastel; Leah M..The latest application filed is for "lateral silicon-on-insulator bipolar junction transistor process and structure".
- Pastel; Leah M. - Essex Junction VT
- Pastel; Leah M. - Essex VT
- Pastel; Leah M. - Ossining NY
- Pastel; Leah M. - Essex Highlands VT
| Patent | Date |
|---|---|
| Lateral silicon-on-insulator bipolar junction transistor process and structure Grant 9,397,203 - Colt, Jr. , et al. July 19, 2 | 2016-07-19 |
| Data mining shape based data Grant 9,244,946 - Kassab , et al. January 26, 2 | 2016-01-26 |
| Data mining shape based data Grant 9,235,601 - Kassab , et al. January 12, 2 | 2016-01-12 |
| Lateral Silicon-on-insulator Bipolar Junction Transistor Process And Structure App 20150214346 - Colt, JR.; John Z. ; et al. | 2015-07-30 |
| Lateral silicon-on-insulator bipolar junction transistor process and structure Grant 9,059,230 - Colt, Jr. , et al. June 16, 2 | 2015-06-16 |
| Data Mining Shape Based Data App 20140149458 - Kassab; Maroun M. ; et al. | 2014-05-29 |
| Data Mining Shape Based Data App 20140149408 - Kassab; Maroun M. ; et al. | 2014-05-29 |
| Identifying defects Grant 8,571,299 - Fayaz , et al. October 29, 2 | 2013-10-29 |
| Insertion of faults in logic model used in simulation Grant 8,566,059 - Desineni , et al. October 22, 2 | 2013-10-22 |
| Identifying Defects App 20120050728 - Fayaz; Mohammed F. ; et al. | 2012-03-01 |
| Insertion Of Faults In Logic Model Used In Simulation App 20110137602 - Desineni; Rao H. ; et al. | 2011-06-09 |
| Scan chain diagnostics using logic paths Grant 7,895,487 - Huisman , et al. February 22, 2 | 2011-02-22 |
| Methods for designing a product chip a priori for design subsetting, feature analysis, and yield learning Grant 7,895,545 - Cohn , et al. February 22, 2 | 2011-02-22 |
| System and method for signature-based systematic condition detection and analysis Grant 7,853,848 - Desineni , et al. December 14, 2 | 2010-12-14 |
| Methods For Designing A Product Chip A Priori For Design Subsetting, Feature Analysis, And Yield Learning App 20090259983 - Cohn; John M. ; et al. | 2009-10-15 |
| System And Method For Signature-based Systematic Condition Detection And Analysis App 20090106614 - Desineni; Rao H. ; et al. | 2009-04-23 |
| Sensor differentiated fault isolation Grant 7,397,263 - Condon , et al. July 8, 2 | 2008-07-08 |
| Scan Chain Diagnostics Using Logic Paths App 20070168805 - Huisman; Leendert M. ; et al. | 2007-07-19 |
| Scan chain diagnostics using logic paths Grant 7,240,261 - Huisman , et al. July 3, 2 | 2007-07-03 |
| Inspection methods and structures for visualizing and/or detecting specific chip structures Grant 7,230,335 - Cann , et al. June 12, 2 | 2007-06-12 |
| Sensor Differentiated Fault Isolation App 20070126450 - Condon; Kevin L. ; et al. | 2007-06-07 |
| Sensor Differentiated Fault Isolation App 20060232284 - Condon; Kevin L. ; et al. | 2006-10-19 |
| Canary Device For Failure Analysis App 20060195285 - Bouchard; Pierre J. ; et al. | 2006-08-31 |
| Inspection Methods And Structures For Visualizing And/or Detecting Specific Chip Structures App 20060071208 - Cann; Jerome L. ; et al. | 2006-04-06 |
| Scan Chain Diagnostics Using Logic Paths App 20050138508 - Huisman, Leendert M. ; et al. | 2005-06-23 |
| Internal cache for on chip test data storage Grant 6,901,542 - Bartenstein , et al. May 31, 2 | 2005-05-31 |
| Internal cache for on chip test data storage App 20030033566 - Bartenstein, Thomas W. ; et al. | 2003-02-13 |
| Apparatus for assisting backside focused ion beam device modification App 20030015671 - Lackey, David E. ; et al. | 2003-01-23 |
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