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name:-0.010844945907593
name:-0.0075161457061768
name:-0.0011448860168457
Parris; Michael Curtis Patent Filings

Parris; Michael Curtis

Patent Applications and Registrations

Patent applications and USPTO patent grants for Parris; Michael Curtis.The latest application filed is for "system and method for testing fuse blow reliability for integrated circuits".

Company Profile
0.9.10
  • Parris; Michael Curtis - San Jose CA
  • Parris, Michael Curtis - Colorado Springs CO
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System and method for testing fuse blow reliability for integrated circuits
Grant 9,557,364 - Parris January 31, 2
2017-01-31
Non-volatile memory devices having vertical drain to gate capacitive coupling
Grant 9,230,814 - Fisch , et al. January 5, 2
2016-01-05
Embedded passive integration
Grant 8,970,003 - Parris March 3, 2
2015-03-03
Common doped region with separate gate control for a logic compatible non-volatile memory cell
Grant 8,873,302 - Fisch , et al. October 28, 2
2014-10-28
System And Method For Testing Fuse Blow Reliability For Integrated Circuits
App 20140253145 - Parris; Michael Curtis
2014-09-11
System and method for testing fuse blow reliability for integrated circuits
Grant 8,736,278 - Parris May 27, 2
2014-05-27
Non-volatile Memory Devices Having Vertical Drain To Gate Capacitive Coupling
App 20130107630 - Fisch; David Edward ;   et al.
2013-05-02
Common Doped Region With Separate Gate Control For A Logic Compatible Non-volatile Memory Cell
App 20130107635 - Fisch; David Edward ;   et al.
2013-05-02
System And Method For Testing Fuse Blow Reliability For Integrated Circuits
App 20130027056 - Parris; Michael Curtis
2013-01-31
Embedded Passive Integration
App 20130027899 - Parris; Michael Curtis
2013-01-31
Small signal, low power read data bus driver for integrated circuit devices incorporating memory arrays
App 20020136051 - Hardee, Kim Carver ;   et al.
2002-09-26

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