Park Systems Corp.

USPTO Trademark & Patent Filings

Trademark applications and grants for Park Systems Corp.. Park Systems Corp. has 6 trademark applications. The latest application filed is for "PARK NANOSTANDARD"

Company Profile

PARK SYSTEMS CORP.
PARK SYSTEMS CORP. - Suwon-si KR
PARK SYSTEMS CORP. - Gyeonggi-do KR
Park Systems Corp. - Suwon-si KR

State Incorporated	KOREA, REPUBLIC OF
Entity Type	CORPORATION
Address	4F, Korea Advanced Nano Fab Center, 109, Gwanggyo-ro, Yeongtonggu, Suwon-si, Gyeonggi-do KOREA, REPUBLIC OF 16229

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks Patents

Patent Applications

Patent Application	Date
METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORCE MICROSCOPE 20220206039 - 17/561920 AN; JeongHun ; et al.	2022-06-30
MEASURING METHOD FOR MEASURING HEAT DISTRIBUTION OF SPECIFIC SPACE USING STHM PROBE, METHOD AND DEVICE FOR DETECTING BEAM SPOT OF LIGHT SOURCE 20210373046 - 17/335094 PARK; Sang-il ; et al.	2021-12-02
CHIP CARRIER EXCHANGING DEVICE AND ATOMIC FORCE MICROSCOPY APPARATUS HAVING SAME 20200386784 - 16/897091 PARK; Sang-il ; et al.	2020-12-10
MEASUREMENT APPARATUS AND METHOD WITH ADAPTIVE SCAN RATE 20160356808 - 14/841650 JO; Ah Jin ; et al.	2016-12-08
Head Limiting Movement Range Of Laser Spot And Atomic Force Microscope Having The Same 20160187373 - 14/757519 Park; Sang-iI ; et al.	2016-06-30

Patent Grants & Applications

Trademark Applications

Mark Image Registration \| Serial	Trademark Application Date
"PARK NANOSTANDARD" 97717170	PARK NANOSTANDARD 2022-12-14
"PARK SMARTANALYSIS" 97717187	PARK SMARTANALYSIS 2022-12-14
"EXCELLENCE IN NANOMETROLOGY" 3451584 77245031	EXCELLENCE IN NANOMETROLOGY 2007-08-02
"PARK SYSTEMS" 3494880 77245006	PARK SYSTEMS 2007-08-02
"XE-3DM" 77245023	XE-3DM 2007-08-02
"XE-3D" 78942698	XE-3D 2006-08-01

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