Park; Sung-Hong

Patent Applications and Registrations

Patent applications and USPTO patent grants for Park; Sung-Hong.The latest application filed is for "method for acquiring variable slab magnetic resonance imaging data".

Company Profile

2.9.9

Park; Sung-Hong - Daejeon KR
Park; Sung-Hong - Pittsburgh PA
Park; Sung-Hong - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for acquiring variable slab magnetic resonance imaging data Grant 11,209,512 - Park , et al. December 28, 2	2021-12-28
MRI approach of multiple times to repeat for detection of neuronal oscillations Grant 11,185,248 - Park , et al. November 30, 2	2021-11-30
Method for varying undersampling dimension for accelerating multiple-acquisition magnetic resonance imaging and device for the same Grant 11,029,381 - Park , et al. June 8, 2	2021-06-08
Method For Acquiring Variable Slab Magnetic Resonance Imaging Data App 20200096585 - PARK; Sung-Hong ; et al.	2020-03-26
Method For Varying Undersampling Dimension For Accelerating Multiple-acquisition Magnetic Resonance Imaging And Device For The S App 20190219654 - PARK; Sung-Hong ; et al.	2019-07-18
Neuronal resonance magnetic resonance imaging method Grant 10,136,834 - Park , et al. November 27, 2	2018-11-27
Mri Approach Of Multiple Times To Repeat For Detection Of Neuronal Oscillations App 20180289282 - Park; Sung-Hong ; et al.	2018-10-11
Neuronal Resonance Magnetic Resonance Imaging Method App 20150238112 - Park; Sung-Hong ; et al.	2015-08-27
Echo-specific K-space reordering approach to compatible dual-echo arteriovenography Grant 8,676,296 - Park , et al. March 18, 2	2014-03-18
Echo-specific K-space Reordering Approach To Compatible Dual-echo Arteriovenography App 20110213237 - Park; Sung-Hong ; et al.	2011-09-01
Method and apparatus for inspecting a substrate Grant 7,747,063 - Lim , et al. June 29, 2	2010-06-29
Method of scanning a substrate, and method and apparatus for analyzing crystal characteristics Grant 7,626,164 - Yoon , et al. December 1, 2	2009-12-01
Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates Grant 7,498,248 - Lim , et al. March 3, 2	2009-03-03
Method Of Scanning A Substrate, And Method And Apparatus For Analyzing Crystal Characteristics App 20070120054 - YOON; Young-Jee ; et al.	2007-05-31
Methods of compensating for an alignment error during fabrication of structures on semiconductor substrates App 20070120220 - Lim; Jung-Taek ; et al.	2007-05-31
Method Of Inspecting A Defect On A Substrate App 20070030479 - PARK; Sung-Hong ; et al.	2007-02-08
Method And Apparatus For Inspecting A Substrate App 20070031025 - Lim; Jung-Taek ; et al.	2007-02-08

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