Park; Jang-ik

Patent Applications and Registrations

Patent applications and USPTO patent grants for Park; Jang-ik.The latest application filed is for "apparatus for liquefying natural gas and method for liquefying natural gas".

Company Profile

5.10.13

Park; Jang-ik - Busan KR
Park; Jang Ik - Gyeonggi-do KR
PARK; Jang Ik - Suwon-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus for liquefying natural gas and method for liquefying natural gas Grant 11,340,013 - Park , et al. May 24, 2	2022-05-24
Piston for internal combustion engine Grant 10,760,526 - Yang , et al. Sep	2020-09-01
Apparatus For Liquefying Natural Gas And Method For Liquefying Natural Gas App 20200208910 - Park; Jang-ik ; et al.	2020-07-02
Substrate Inspection Apparatus, Method Of Calibrating The Substrate Inspection Apparatus, And Method Of Fabricating Semiconducto App 20200182777 - PARK; Jang Ik ; et al.	2020-06-11
Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement Grant 10,410,937 - Park , et al. Sept	2019-09-10
Piston For Internal Combustion Engine App 20190218997 - YANG; Jun Kui ; et al.	2019-07-18
Optical Measuring Method For Semiconductor Wafer Including A Plurality Of Patterns And Method Of Manufacturing Semiconductor Dev App 20190181062 - PARK; Jang Ik ; et al.	2019-06-13
Mooring apparatus for offshore construction Grant 9,919,770 - Park , et al. March 20, 2	2018-03-20
Piston For Internal Combustion Engine, And Cooling Channel Core App 20170314452 - PARK; Jang Ik ; et al.	2017-11-02
Optical measuring methods and apparatus Grant 9,593,940 - Seo , et al. March 14, 2	2017-03-14
Optical measuring methods and system Grant 9,417,180 - Seo , et al. August 16, 2	2016-08-16
Optical Measuring Methods and Apparatus App 20160061585 - Seo; Dong-Min ; et al.	2016-03-03
Method for measuring thickness of object Grant 9,255,789 - Park , et al. February 9, 2	2016-02-09
Optical Measuring Methods and System App 20150362367 - Seo; Dong-Min ; et al.	2015-12-17
Inspection System And Methods Of Fabricating And Inspecting Semiconductor Device Using The Same App 20150355108 - PARK; Jang Ik ; et al.	2015-12-10
Method For Measuring Thickness Of Object App 20150029517 - PARK; Jang-Ik ; et al.	2015-01-29
Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis Grant 8,551,791 - Park , et al. October 8, 2	2013-10-08
Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis App 20090325326 - Park; Jang-Ik ; et al.	2009-12-31
Apparatus And Method For Inspecting A Wafer App 20080186472 - Park; Jae-Woo ; et al.	2008-08-07
Test Pattern And Method For Measuring Silicon Etching Depth App 20070184565 - PARK; Hwan-Shik ; et al.	2007-08-09
Method and apparatus for measuring thickness of metal layer Grant 7,197,426 - Park , et al. March 27, 2	2007-03-27
Method and apparatus for measuring thickness of metal layer App 20060052979 - Park; Jang-Ik ; et al.	2006-03-09

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.