loadpatents
name:-0.017093896865845
name:-0.0077698230743408
name:-0.0029571056365967
Park; Jae Eon Patent Filings

Park; Jae Eon

Patent Applications and Registrations

Patent applications and USPTO patent grants for Park; Jae Eon.The latest application filed is for "silicon precursor compounds and method for forming silicon-containing films".

Company Profile
2.7.13
  • Park; Jae Eon - GyeongGi-Do KR
  • PARK; Jae Eon - HwaSung-City KR
  • PARK; Jae Eon - HwaSung KR
  • Park; Jae-eon - Fishkill NY
  • Park; Jae-eon - Yongsin-si KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for forming carbon rich silicon-containing films
Grant 11,414,750 - Cho , et al. August 16, 2
2022-08-16
Silicon Precursor Compounds And Method For Forming Silicon-containing Films
App 20210395884 - CHO; Sungsil ;   et al.
2021-12-23
Precursors And Methods For Preparing Silicon-containing Films
App 20210301400 - LEE; SangJin ;   et al.
2021-09-30
Haloalkynyl Dicobalt Hexacarbonyl Precursors For Chemical Vapor Deposition Of Cobalt
App 20210082708 - HAN; Sangbum ;   et al.
2021-03-18
Method For Forming Carbon Rich Silicon-containing Films
App 20200354830 - CHO; Sungsil ;   et al.
2020-11-12
Methods of forming integrated circuit devices having ion-cured electrically insulating layers therein
Grant 7,838,390 - Kim , et al. November 23, 2
2010-11-23
CMOS integrated circuit devices having stressed NMOS and PMOS channel regions therein
Grant 7,800,134 - Lee , et al. September 21, 2
2010-09-21
Methods of Forming Electrical Interconnects Using Thin Electrically Insulating Liners in Contact Holes
App 20100029072 - Park; Jae-Eon ;   et al.
2010-02-04
CMOS Integrated Circuit Devices Having Stressed NMOS and PMOS Channel Regions Therein
App 20090194817 - Lee; Kyoung-woo ;   et al.
2009-08-06
Methods of forming integrated circuit structures using insulator deposition and insulator gap filling techniques
Grant 7,541,288 - Kim , et al. June 2, 2
2009-06-02
Methods of forming CMOS integrated circuit devices having stressed NMOS and PMOS channel regions therein and circuits formed thereby
Grant 7,534,678 - Lee , et al. May 19, 2
2009-05-19
Methods of Forming Integrated Circuit Devices Having Ion-Cured Electrically Insulating Layers Therein
App 20090098706 - Kim; Jun-jung ;   et al.
2009-04-16
Methods of Forming CMOS Integrated Circuit Devices Having Stressed NMOS and PMOS Channel Regions Therein and Circuits Formed Thereby
App 20080242015 - Lee; Kyoung-woo ;   et al.
2008-10-02
Methods of Forming Integrated Circuit Structures Using Insulator Deposition and Insulator Gap Filling Techniques
App 20080220584 - Kim; Jun-jung ;   et al.
2008-09-11
Methods of Forming CMOS Integrated Circuits Using Gate Sidewall Spacer Reduction Techniques
App 20080124859 - Sun; Min Chul ;   et al.
2008-05-29
Semiconductor Device Having a Dual Stress Liner and Light Exposure Apparatus for Forming the Dual Stress Liner
App 20080029823 - Park; Jae-Eon ;   et al.
2008-02-07
Method of fabricating semiconductor device
Grant 7,323,419 - Jung , et al. January 29, 2
2008-01-29
Methods of fabricating semiconductor devices having a dual stress liner
Grant 7,297,584 - Park , et al. November 20, 2
2007-11-20
Semiconductor device having a dual stress liner, method of manufacturing the semiconductor device and light exposure apparatus for forming the dual stress liner
App 20070082439 - Park; Jae-Eon ;   et al.
2007-04-12
Method of fabricating semiconductor device
App 20060175289 - Jung; Hyung-suk ;   et al.
2006-08-10

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