Park; Hwan-Shik

Patent Applications and Registrations

Patent applications and USPTO patent grants for Park; Hwan-Shik.The latest application filed is for "light focusing unit and spectrum measuring apparatus having the same".

Company Profile

0.7.6

Park; Hwan-Shik - Seoul KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis Grant 8,551,791 - Park , et al. October 8, 2	2013-10-08
Light focusing unit and spectrum measuring apparatus having the same Grant 8,446,583 - Kim , et al. May 21, 2	2013-05-21
Light focusing unit and spectrum measuring apparatus having the same App 20100277729 - Kim; Hyun-Jong ; et al.	2010-11-04
Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis App 20090325326 - Park; Jang-Ik ; et al.	2009-12-31
Methods of manufacturing a semiconductor device Grant 7,375,003 - Yoon , et al. May 20, 2	2008-05-20
Apparatus and method for measuring a thickness of a substrate Grant 7,355,729 - Park , et al. April 8, 2	2008-04-08
Test Pattern And Method For Measuring Silicon Etching Depth App 20070184565 - PARK; Hwan-Shik ; et al.	2007-08-09
Method and apparatus for measuring thickness of metal layer Grant 7,197,426 - Park , et al. March 27, 2	2007-03-27
Methods of manufacturing a semiconductor device App 20060073691 - Yoon; Joo-Byoung ; et al.	2006-04-06
Method and apparatus for measuring thickness of metal layer App 20060052979 - Park; Jang-Ik ; et al.	2006-03-09
Apparatus and method for measuring a thickness of a substrate App 20050083539 - Park, Hwan-Shik ; et al.	2005-04-21

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