loadpatents
name:-0.040884971618652
name:-0.039558887481689
name:-0.017513990402222
Park; Allen Patent Filings

Park; Allen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Park; Allen.The latest application filed is for "method and system for mixed mode wafer inspection".

Company Profile
18.40.38
  • Park; Allen - San Jose CA
  • Park; Allen - Salter Point AU
  • - San Jose CA US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And System For Mixed Mode Wafer Inspection
App 20220230293 - Lin; Jason Z. ;   et al.
2022-07-21
Method and system for mixed mode wafer inspection
Grant 11,295,438 - Lin , et al. April 5, 2
2022-04-05
Blasting method and system
Grant 11,060,832 - Park July 13, 2
2021-07-13
Measurement of Overlay Error Using Device Inspection System
App 20210159128 - Hoo; Choon Hoong ;   et al.
2021-05-27
Measurement of overlay error using device inspection system
Grant 10,943,838 - Hoo , et al. March 9, 2
2021-03-09
Computer Assisted Weak Pattern Detection and Quantification System
App 20200372630 - Haque; Naoshin ;   et al.
2020-11-26
Using stochastic failure metrics in semiconductor manufacturing
Grant 10,818,001 - Leung , et al. October 27, 2
2020-10-27
Hybrid design layout to identify optical proximity correction-related systematic defects
Grant 10,796,065 - Park , et al. October 6, 2
2020-10-06
Computer assisted weak pattern detection and quantification system
Grant 10,740,888 - Haque , et al. A
2020-08-11
Using Stochastic Failure Metrics In Semiconductor Manufacturing
App 20200082523 - Leung; Wing-Shan Ribi ;   et al.
2020-03-12
Blasting Method And System
App 20200033107 - Park; Allen
2020-01-30
Hybrid Design Layout To Identify Optical Proximity Correction-related Systematic Defects
App 20190392111 - Park; Allen ;   et al.
2019-12-26
Self directed metrology and pattern classification
Grant 10,483,081 - Park , et al. Nov
2019-11-19
Measurement of Overlay Error Using Device Inspection System
App 20190252270 - Hoo; Choon Hoong ;   et al.
2019-08-15
Determining one or more characteristics of a pattern of interest on a specimen
Grant 10,359,371 - Duffy , et al.
2019-07-23
System, method and computer program product for systematic and stochastic characterization of pattern defects identified from a semiconductor wafer
Grant 10,262,408 - Park , et al.
2019-04-16
Method and system for weak pattern quantification
Grant 10,262,831 - Cross , et al.
2019-04-16
Method and System for Mixed Mode Wafer Inspection
App 20190108630 - Lin; Jason Z. ;   et al.
2019-04-11
Based device risk assessment
Grant 10,223,492 - Park , et al.
2019-03-05
Method and system for mixed mode wafer inspection
Grant 10,192,303 - Lin , et al. Ja
2019-01-29
Image based specimen process control
Grant 10,181,185 - Park , et al. Ja
2019-01-15
System, Method And Computer Program Product For Systematic And Stochastic Characterization Of Pattern Defects Identified From A Semiconductor Wafer
App 20180300870 - Park; Allen ;   et al.
2018-10-18
Finding patterns in a design based on the patterns and their surroundings
Grant 10,062,012 - Park , et al. August 28, 2
2018-08-28
Blasting systems and methods
Grant 10,030,959 - Park July 24, 2
2018-07-24
Method and System for Weak Pattern Quantification
App 20180174797 - Cross; Andrew ;   et al.
2018-06-21
System, method and computer program product for detecting defects in a fabricated target component using consistent modulation for the target and reference components
Grant 9,940,705 - Park , et al. April 10, 2
2018-04-10
System, Method And Computer Program Product For Detecting Defects In A Fabricated Target Component Using Consistent Modulation For The Target And Reference Components
App 20170323434 - Park; Allen ;   et al.
2017-11-09
Computer Assisted Weak Pattern Detection and Quantification System
App 20170309009 - Haque; Naoshin ;   et al.
2017-10-26
Image Based Specimen Process Control
App 20170200264 - Park; Allen ;   et al.
2017-07-13
Using Three-dimensional Representations For Defect-related Applications
App 20170161418 - Park; Allen ;   et al.
2017-06-08
Determining One or More Characteristics of a Pattern of Interest on a Specimen
App 20170059491 - Duffy; Brian ;   et al.
2017-03-02
Method and system for universal target based inspection and metrology
Grant 9,576,861 - Park , et al. February 21, 2
2017-02-21
Pattern failure discovery by leveraging nominal characteristics of alternating failure modes
Grant 9,536,299 - Park January 3, 2
2017-01-03
Self Directed Metrology and Pattern Classification
App 20160372303 - Park; Allen ;   et al.
2016-12-22
Metrology optimized inspection
Grant 9,518,932 - Park , et al. December 13, 2
2016-12-13
Methods and systems for utilizing design data in combination with inspection data
Grant 9,401,014 - Zafar , et al. July 26, 2
2016-07-26
Blasting Systems And Methods
App 20160138899 - Park; Allen
2016-05-19
Inspection guided overlay metrology
Grant 9,170,209 - Chang , et al. October 27, 2
2015-10-27
Determining design coordinates for wafer defects
Grant 9,087,367 - Chang , et al. July 21, 2
2015-07-21
Pattern Failure Discovery by Leveraging Nominal Characteristics of Alternating Failure Modes
App 20150199803 - Park; Allen
2015-07-16
Methods and Systems for Utilizing Design Data in Combination with Inspection Data
App 20150154746 - Zafar; Khurram ;   et al.
2015-06-04
Metrology Optimized Inspection
App 20150124247 - Park; Allen ;   et al.
2015-05-07
Detecting IC Reliability Defects
App 20150120220 - Wu; Joanne ;   et al.
2015-04-30
Region based virtual fourier filter
Grant 8,989,479 - Gao , et al. March 24, 2
2015-03-24
Inspecting a wafer and/or predicting one or more characteristics of a device being formed on a wafer
Grant 8,948,495 - Marcuccilli , et al. February 3, 2
2015-02-03
Methods and systems for utilizing design data in combination with inspection data
Grant 8,923,600 - Zafar , et al. December 30, 2
2014-12-30
Methods and systems for utilizing design data in combination with inspection data
Grant 08923600 -
2014-12-30
Alteration for wafer inspection
Grant 8,826,200 - Park , et al. September 2, 2
2014-09-02
Method and System for Universal Target Based Inspection and Metrology
App 20140199791 - Park; Allen ;   et al.
2014-07-17
Method and System for Mixed Mode Wafer Inspection
App 20140153814 - Lin; Jason Z. ;   et al.
2014-06-05
Based device risk assessment
Grant 8,656,323 - Park , et al. February 18, 2
2014-02-18
Inspecting a Wafer and/or Predicting One or More Characteristics of a Device Being Formed on a Wafer
App 20140037187 - Marcuccilli; Gino ;   et al.
2014-02-06
Design Alteration for Wafer Inspection
App 20130318485 - Park; Allen ;   et al.
2013-11-28
Scanner performance comparison and matching using design and defect data
Grant 8,594,823 - Park , et al. November 26, 2
2013-11-26
Inspection guided overlay metrology
Grant 8,559,001 - Chang , et al. October 15, 2
2013-10-15
Determining Design Coordinates for Wafer Defects
App 20130064442 - Chang; Ellis ;   et al.
2013-03-14
Using Three-Dimensional Representations for Defect-Related Applications
App 20120316855 - Park; Allen ;   et al.
2012-12-13
Design Based Device Risk Assessment
App 20120216169 - Park; Allen ;   et al.
2012-08-23
Region Based Virtual Fourier Filter
App 20120141013 - Gao; Lisheng ;   et al.
2012-06-07
Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functions
Grant 8,194,968 - Park , et al. June 5, 2
2012-06-05
Inspection Guided Overlay Metrology
App 20110170091 - Chang; Ellis ;   et al.
2011-07-14
Scanner Performance Comparison And Matching Using Design And Defect Data
App 20110172804 - Park; Allen ;   et al.
2011-07-14
Computer-implemented methods for determining if actual defects are potentially systematic defects or potentially random defects
Grant 7,975,245 - Florence , et al. July 5, 2
2011-07-05
Computer-implemented methods, carrier media, and systems for generating a metrology sampling plan
Grant 7,711,514 - Park , et al. May 4, 2
2010-05-04
Methods And Systems For Utilizing Design Data In Combination With Inspection Data
App 20090297019 - Zafar; Khurram ;   et al.
2009-12-03
Methods and systems for utilizing design data in combination with inspection data
Grant 7,570,796 - Zafar , et al. August 4, 2
2009-08-04
Computer-implemented Methods For Determining If Actual Defects Are Potentially Systematic Defects Or Potentially Random Defects
App 20090055783 - Florence; Glenn ;   et al.
2009-02-26
Computer-implemented Methods, Carrier Media, And Systems For Generating A Metrology Sampling Plan
App 20090043527 - Park; Allen ;   et al.
2009-02-12
Methods And Systems For Using Electrical Information For A Device Being Fabricated On A Wafer To Perform One Or More Defect-related Functions
App 20080167829 - Park; Allen ;   et al.
2008-07-10
Methods And Systems For Utilizing Design Data In Combination With Inspection Data
App 20070288219 - Zafar; Khurram ;   et al.
2007-12-13

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