Pang; Kwok-Hung Grantham
Patent Applications and Registrations
Patent applications and USPTO patent grants for Pang; Kwok-Hung Grantham.The latest application filed is for "defect detection system for quality assurance using automated visual inspection".
- Pang; Kwok-Hung Grantham - Pokfulam HK
- Pang; Kwok-Hung Grantham - Hong Kong CN
| Patent | Date |
|---|---|
| Method of and device for inspecting images to detect defects Grant 6,804,381 - Pang , et al. October 12, 2 | 2004-10-12 |
| Defect detection system for quality assurance using automated visual inspection Grant 6,753,965 - Kumar , et al. June 22, 2 | 2004-06-22 |
| Defect detection system for quality assurance using automated visual inspection App 20030081215 - Kumar, Ajay ; et al. | 2003-05-01 |
| Method of and device for inspecting images to detect defects App 20020054293 - Pang, Kwok-Hung Grantham ; et al. | 2002-05-09 |
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