Pan; Judon Tony

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pan; Judon Tony.The latest application filed is for "method of fabricating a gate-all-around word line for a vertical channel dram".

Company Profile

0.7.8

Pan; Judon Tony - Saratoga CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of fabricating a gate-all-around word line for a vertical channel DRAM Grant 9,023,723 - Chang , et al. May 5, 2	2015-05-05
Method of fabricating a gate-all-around word line for a vertical channel dram App 20130323920 - Chang; Chorng-Ping ; et al.	2013-12-05
Integrated equipment set for forming a low K dielectric interconnect on a substrate App 20060246683 - Pan; Judon Tony ; et al.	2006-11-02
Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers Grant 6,913,511 - Wiswesser , et al. July 5, 2	2005-07-05
Bond pad techniques for integrated circuits App 20050048772 - Pan, Judon Tony	2005-03-03
Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers App 20040116047 - Wiswesser, Andreas Norbert ; et al.	2004-06-17
Integrated equipment set for forming a low K dielectric interconnect on a substrate App 20040007325 - Pan, Judon Tony ; et al.	2004-01-15
Method and apparatus for optical monitoring in chemical mechanical polishing Grant 6,659,842 - Wiswesser , et al. December 9, 2	2003-12-09
Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers Grant 6,652,355 - Wiswesser , et al. November 25, 2	2003-11-25
Method and apparatus for optical monitoring in chemical mechanical polishing App 20020013120 - Wiswesser, Andreas Norbert ; et al.	2002-01-31
Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers App 20010036793 - Wiswesser, Andreas Norbert ; et al.	2001-11-01
Method and apparatus for optical monitoring in chemical mechanical polishing Grant 6,296,548 - Wiswesser , et al. October 2, 2	2001-10-02
Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers Grant 6,280,289 - Wiswesser , et al. August 28, 2	2001-08-28

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