Palmer; Todd A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Palmer; Todd A..The latest application filed is for "slit disk for modified faraday cup diagnostic for determing power density of electron and ion beams".

Company Profile

0.5.7

Palmer; Todd A. - State College PA
Palmer; Todd A. - Livermore CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams Grant 7,902,503 - Teruya , et al. March 8, 2	2011-03-08
Slit Disk for Modified Faraday Cup Diagnostic for Determing Power Density of Electron and Ion Beams App 20100032562 - Teruya; Alan T. ; et al.	2010-02-11
Miniature modified Faraday cup for micro electron beams Grant 7,378,830 - Teruya , et al. May 27, 2	2008-05-27
Miniature Modified Faraday Cup For Micro Electron Beams App 20080088295 - Teruya; Alan T. ; et al.	2008-04-17
Electron beam diagnostic for profiling high power beams Grant 7,348,568 - Elmer , et al. March 25, 2	2008-03-25
Diagnostic system for profiling micro-beams Grant 7,288,772 - Elmer , et al. October 30, 2	2007-10-30
Automatic focusing of electron beams using a modified Faraday cup diagnostic App 20070210041 - Elmer; John W. ; et al.	2007-09-13
Trigger probe for determining the orientation of the power distribution of an electron beam Grant 7,244,950 - Elmer , et al. July 17, 2	2007-07-17
Micro-joining using electron beams App 20060196853 - Elmer; John W. ; et al.	2006-09-07
Trigger probe for determining the orientation of the power distribution of an electron beam App 20060038139 - Elmer; John W. ; et al.	2006-02-23
Electron beam diagnostic for profiling high power beams App 20050285047 - Elmer, John W. ; et al.	2005-12-29
Diagnostic system for profiling micro-beams App 20050242299 - Elmer, John W. ; et al.	2005-11-03

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