Pakdaman; Nader

Patent Applications and Registrations

Patent applications and USPTO patent grants for Pakdaman; Nader.The latest application filed is for "integrated photodiode for semiconductor substrates".

Company Profile

0.22.23

Pakdaman; Nader - Los Gatos CA
Pakdaman; Nader - Monte Sereno CA
Pakdaman; Nader - Monte Serano CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Integrated Photodiode For Semiconductor Substrates App 20160104812 - Steinbrueck; Gary ; et al.	2016-04-14
Contactless technique for evaluating a fabrication of a wafer Grant 8,990,759 - Aghababazadeh , et al. March 24, 2	2015-03-24
Integrated Photodiode For Semiconductor Substrates App 20130334644 - Steinbrueck; Gary ; et al.	2013-12-19
Integrated photodiode for semiconductor substrates Grant 8,410,568 - Steinbrueck , et al. April 2, 2	2013-04-02
Test structures for evaluating a fabrication of a die or a wafer Grant 8,344,745 - Aghababazadeh , et al. January 1, 2	2013-01-01
Contactless Technique For Evaluating A Fabrication Of A Wafer App 20100304509 - Aghababazadeh; Majid ; et al.	2010-12-02
System and apparatus for using test structures inside of a chip during the fabrication of the chip Grant 7,736,916 - Aghababazadeh , et al. June 15, 2	2010-06-15
Contactless technique for evaluating a fabrication of a wafer Grant 7,730,434 - Aghababazadeh , et al. June 1, 2	2010-06-01
System for using test structures to evaluate a fabrication of a wafer Grant 7,723,724 - Aghababazadeh , et al. May 25, 2	2010-05-25
Integrated Photodiode For Semiconductor Substrates App 20100084729 - Steinbrueck; Gary ; et al.	2010-04-08
Intra-chip power and test signal generation for use with test structures on wafers Grant 7,605,597 - Aghababazadeh , et al. October 20, 2	2009-10-20
Bi-convex solid immersion lens Grant 7,492,529 - Pakdaman , et al. February 17, 2	2009-02-17
Technique For Evaluating A Fabrication Of A Die And Wafer App 20080315196 - AGHABABAZADEH; Majid ; et al.	2008-12-25
Time resolved non-invasive diagnostics system Grant 7,466,852 - Cotton , et al. December 16, 2	2008-12-16
Technique for evaluating a fabrication of a die and wafer Grant 7,423,288 - Aghababazadeh , et al. September 9, 2	2008-09-09
Intra-chip Power And Test Signal Generation For Use With Test Structures On Wafers App 20080100319 - Aghababazadeh; Majid ; et al.	2008-05-01
Intra-clip power and test signal generation for use with test structures on wafers Grant 7,339,388 - Aghababazadeh , et al. March 4, 2	2008-03-04
System And Apparatus For Using Test Structures Inside Of A Chip During The Fabrication Of The Chip App 20070238206 - Aghababazadeh; Majid ; et al.	2007-10-11
System And Apparatus For Using Test Structures Inside Of A Chip During The Fabrication Of The Chip App 20070236232 - Aghababazadeh; Majid ; et al.	2007-10-11
Bi-convex Solid Immersion Lens App 20070205795 - PAKDAMAN; Nader ; et al.	2007-09-06
Time Resolved Non-invasive Diagnostics System App 20070206846 - COTTON; Daniel Murdoch ; et al.	2007-09-06
Technique For Evaluating A Fabrication Of A Die And Wafer App 20070187679 - Aghababazadeh; Majid ; et al.	2007-08-16
System and apparatus for using test structures inside of a chip during the fabrication of the chip Grant 7,256,055 - Aghababazadeh , et al. August 14, 2	2007-08-14
Bi-convex solid immersion lens Grant 7,227,702 - Pakdaman , et al. June 5, 2	2007-06-05
Time resolved non-invasive diagnostics system Grant 7,224,828 - Cotton , et al. May 29, 2	2007-05-29
Technique for evaluating a fabrication of a die and wafer Grant 7,220,990 - Aghababazadeh , et al. May 22, 2	2007-05-22
Technique For Evaluating A Fabrication Of A Die And Wafer App 20070004063 - Aghababazadeh; Majid ; et al.	2007-01-04
Apparatus and method for dynamic diagnostic testing of integrated circuits App 20060103378 - Pakdaman; Nader ; et al.	2006-05-18
Intra-chip power and test signal generation for use with test structures on wafers App 20050090916 - Aghababazadeh, Majid ; et al.	2005-04-28
System and apparatus for using test structures inside of a chip during the fabrication of the chip App 20050090027 - Aghababazadeh, Majid ; et al.	2005-04-28
Technique for evaluating a fabrication of a die and wafer App 20050085032 - Aghababazadeh, Majid ; et al.	2005-04-21
Technique for evaluating a fabrication of a semiconductor component and wafer App 20050085932 - Aghababazadeh, Majid ; et al.	2005-04-21
Apparatus and method for dynamic diagnostic testing of integrated circuits Grant 6,859,031 - Pakdaman , et al. February 22, 2	2005-02-22
Spray cooling and transparent cooling plate thermal management system Grant 6,836,131 - Cader , et al. December 28, 2	2004-12-28
Bi-convex solid immersion lens App 20040240074 - Pakdaman, Nader ; et al.	2004-12-02
Bi-convex solid immersion lens Grant 6,778,327 - Pakdaman , et al. August 17, 2	2004-08-17
Spray cooling and transparent cooling plate thermal management system App 20040032275 - Cader, Tahir ; et al.	2004-02-19
Time resolved non-invasive diagnostics system App 20030210057 - Cotton, Daniel Murdoch ; et al.	2003-11-13
Bi-convex solid immersion lens App 20030202255 - Pakdaman, Nader ; et al.	2003-10-30
Time resolved non-invasive diagnostics system Grant 6,621,275 - Cotton , et al. September 16, 2	2003-09-16
Apparatus and method for dynamic diagnostic testing of integrated circuits App 20030146761 - Pakdaman, Nader ; et al.	2003-08-07
Bi-convex solid immersion lens Grant 6,594,086 - Pakdaman , et al. July 15, 2	2003-07-15
Time resolved non-invasive diagnostics system App 20030098692 - Cotton, Daniel Murdoch ; et al.	2003-05-29