Pai; Ajay
Patent Applications and Registrations
Patent applications and USPTO patent grants for Pai; Ajay.The latest application filed is for "migration of settings from a non-connected building controller to another building controller".
- Pai; Ajay - Maple Grove MN
- Pai; Ajay - Crystal MN
- Pai; Ajay - Bloomington MN
| Patent | Date |
|---|---|
| Migration Of Settings From A Non-connected Building Controller To Another Building Controller App 20220042697 - Kraft; Nathaniel D. ; et al. | 2022-02-10 |
| Migration of settings from a non-connected building controller to another building controller Grant 11,156,375 - Kraft , et al. October 26, 2 | 2021-10-26 |
| Bluetooth Thermostat And Hub App 20200272115 - Emmons; David J. ; et al. | 2020-08-27 |
| Thermostat system for remote reading, setting, and control of devices Grant 10,691,083 - Emmons , et al. | 2020-06-23 |
| Comfort mapping using wearables Grant 10,372,093 - Davalos , et al. | 2019-08-06 |
| Migration Of Settings From A Non-connected Building Controller To Another Building Controller App 20180023837 - Kraft; Nathaniel D. ; et al. | 2018-01-25 |
| Comfort Mapping Using Wearables App 20160252267 - Davalos; Pedro ; et al. | 2016-09-01 |
| Bluetooth Thermostat And Hub App 20160040903 - Emmons; David J. ; et al. | 2016-02-11 |
| Wafer edge inspection illumination system Grant 9,062,859 - Voges , et al. June 23, 2 | 2015-06-23 |
| Wafer edge inspection and metrology Grant 8,818,074 - Pai , et al. August 26, 2 | 2014-08-26 |
| Wafer Edge Inspection App 20140063799 - Voges; Christopher ; et al. | 2014-03-06 |
| Method of monitoring fabrication processing including edge bead removal processing Grant 8,492,178 - Carlson , et al. July 23, 2 | 2013-07-23 |
| Wafer edge inspection Grant 8,426,223 - Voges , et al. April 23, 2 | 2013-04-23 |
| Wafer Edge Inspection And Metrology App 20130022260 - Pai; Ajay ; et al. | 2013-01-24 |
| Wafer edge inspection and metrology Grant 8,175,372 - Pai , et al. May 8, 2 | 2012-05-08 |
| Wafer Edge Inspection App 20110263049 - Voges; Christopher ; et al. | 2011-10-27 |
| Wafer Edge Inspection And Metrology App 20110085725 - Pai; Ajay ; et al. | 2011-04-14 |
| Wafer Fabrication Monitoring Systems And Methods, Including Edge Bead Removal Processing App 20110054659 - Carlson; Alan ; et al. | 2011-03-03 |
| Wafer edge inspection and metrology Grant 7,865,010 - Pai , et al. January 4, 2 | 2011-01-04 |
| Wafer Edge Inspection And Metrology App 20100086197 - Pai; Ajay ; et al. | 2010-04-08 |
| Wafer edge inspection and metrology Grant 7,616,804 - Pai , et al. November 10, 2 | 2009-11-10 |
| Wafer edge inspection and metrology App 20080013822 - Pai; Ajay ; et al. | 2008-01-17 |
| Method for identification of cotton contaminants with x-ray microtomographic image analysis Grant 6,870,897 - Sari-Sarraf , et al. March 22, 2 | 2005-03-22 |
| Method for identification of cotton contaminants with x-ray microtomographic image analysis App 20030123608 - Sari-Sarraf, Hamed ; et al. | 2003-07-03 |
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