loadpatents
name:-0.10336899757385
name:-0.013920068740845
name:-0.0077221393585205
PAE; SANGWOO Patent Filings

PAE; SANGWOO

Patent Applications and Registrations

Patent applications and USPTO patent grants for PAE; SANGWOO.The latest application filed is for "semiconductor package device".

Company Profile
8.14.23
  • PAE; SANGWOO - Suwon-si KR
  • PAE; SANGWOO - SEONGNAM-SI KR
  • Pae; Sangwoo - Beaverton OR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor Package Device
App 20220301969 - NOH; Hyunggyun ;   et al.
2022-09-22
Semiconductor Device Including Via And Wiring
App 20220148965 - LEE; MIJI ;   et al.
2022-05-12
Semiconductor device including via and wiring
Grant 11,239,162 - Lee , et al. February 1, 2
2022-02-01
Semiconductor Device Including Via And Wiring
App 20210043556 - LEE; MIJI ;   et al.
2021-02-11
Method Of Fabricating A Semiconductor Device
App 20200395463 - PARK; Byungjae ;   et al.
2020-12-17
Simulation System Estimating Self-heating Characteristic Of Circuit And Design Method Thereof
App 20190294748 - JEON; JONGWOOK ;   et al.
2019-09-26
Memory devices including one-time programmable memory cells
Grant 10,355,004 - Choi , et al. July 16, 2
2019-07-16
Simulation System Estimating Self-heating Characteristic Of Circuit And Design Method Thereof
App 20190130059 - JEON; JONGWOOK ;   et al.
2019-05-02
Simulation system estimating self-heating characteristic of circuit and design method thereof
Grant 10,216,876 - Jeon , et al. Feb
2019-02-26
Semiconductor devices including electrodes for temperature measurement
Grant 10,048,137 - Lee , et al. August 14, 2
2018-08-14
Memory Devices Including One-time Programmable Memory Cells
App 20160093621 - Choi; Hyun-Min ;   et al.
2016-03-31
Simulation System Estimating Self-heating Characteristic Of Circuit And Design Method Thereof
App 20160048622 - JEON; JONGWOOK ;   et al.
2016-02-18
Semiconductor Devices Including Electrodes For Temperature Measurement
App 20150098489 - LEE; Kyongtaek ;   et al.
2015-04-09
Method of forming programmable anti-fuse element
Grant 8,101,471 - Hafez , et al. January 24, 2
2012-01-24
Process charging and electrostatic damage protection in silicon-on-insulator technology
Grant 7,755,140 - Pae , et al. July 13, 2
2010-07-13
Programmable fuse and anti-fuse elements and methods of changing conduction states of same
App 20100164603 - Hafez; Walid M. ;   et al.
2010-07-01
Method for making a semiconductor device having a high-k gate dielectric
Grant 7,709,909 - Doczy , et al. May 4, 2
2010-05-04
High voltage compliant apparatus for semiconductor fabrication process charging protection
App 20090323235 - Pae; Sangwoo ;   et al.
2009-12-31
Semiconductor device having a metal gate electrode formed on an annealed high-k gate dielectric layer
Grant 7,531,404 - Pae , et al. May 12, 2
2009-05-12
Method For Making A Semiconductor Device Having A High-k Gate Dielectric
App 20090020836 - Doczy; Mark L. ;   et al.
2009-01-22
Method for making a semiconductor device having a high-k gate dielectric
Grant 7,442,983 - Doczy , et al. October 28, 2
2008-10-28
High quality silicon oxynitride transition layer for high-k/metal gate transistors
App 20080242012 - Pae; Sangwoo ;   et al.
2008-10-02
Method for making a semiconductor device with a high-k gate dielectric and a metal gate electrode
Grant 7,381,608 - Brask , et al. June 3, 2
2008-06-03
Process charging and electrostatic damage protection in silicon-on-insulator technology
App 20080105925 - Pae; Sangwoo ;   et al.
2008-05-08
Method to fabricate high-k/metal gate transistors using a double capping layer process
App 20080076216 - Pae; Sangwoo ;   et al.
2008-03-27
Methods to create dual-gate dielectrics in transistors using high-K dielectric
App 20080070367 - Pae; Sangwoo ;   et al.
2008-03-20
Semiconductor device having a metal gate electrode formed on an annealed high-k gate dielectric layer
App 20070045753 - Pae; Sangwoo ;   et al.
2007-03-01
Method for making a semiconductor device having a high-k gate dielectric
Grant 7,084,038 - Doczy , et al. August 1, 2
2006-08-01
Method for making a semiconductor device having a high-k gate dielectric
App 20060166447 - Doczy; Mark L. ;   et al.
2006-07-27
Method for making a semiconductor device having a high-k gate dielectric
Grant 7,074,680 - Doczy , et al. July 11, 2
2006-07-11
Method for making a semiconductor device with a high-k gate dielectric and a metal gate electrode
App 20060121678 - Brask; Justin K. ;   et al.
2006-06-08
Method for making a semiconductor device having a high-k gate dielectric
App 20060051880 - Doczy; Mark L. ;   et al.
2006-03-09
Method for making a semiconductor device having a high-k gate dielectric
App 20060051882 - Doczy; Mark L. ;   et al.
2006-03-09

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