loadpatents
name:-0.0089449882507324
name:-0.0072720050811768
name:-0.0017609596252441
Padeffke; Martin Patent Filings

Padeffke; Martin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Padeffke; Martin.The latest application filed is for "ate compatible high-efficient functional test".

Company Profile
1.6.6
  • Padeffke; Martin - Hemmingen DE
  • Padeffke; Martin - Hildrizhausen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
ATE compatible high-efficient functional test
Grant 10,768,232 - Gentner , et al. Sep
2020-09-08
Ate Compatible High-efficient Functional Test
App 20190018061 - Gentner; Thomas ;   et al.
2019-01-17
Verification of intellectual property core trusted state
Grant 9,336,391 - Lichtenau , et al. May 10, 2
2016-05-10
Verification of intellectual property core trusted state
Grant 9,336,392 - Lichtenau , et al. May 10, 2
2016-05-10
Verification Of Intellectual Property Core Trusted State
App 20160004865 - Lichtenau; Cedric ;   et al.
2016-01-07
Verification Of Intellectual Property Core Trusted State
App 20150363337 - Lichtenau; Cedric ;   et al.
2015-12-17
Method for performing a test case with a LBIST engine on an integrated circuit, integrated circuit and method for specifying an integrated circuit
Grant 7,877,655 - Le , et al. January 25, 2
2011-01-25
Integrated circuit for writing and reading registers distributed across a semiconductor chip
Grant 7,861,129 - Le , et al. December 28, 2
2010-12-28
Method For Performing Logic Built-in-self-test Cycles On A Semiconductor Chip And A Corresponding Semiconductor Chip With A Test Engine
App 20090228751 - Gloekler; Tilman ;   et al.
2009-09-10
Topology for a n-way XOR/XNOR circuit
Grant 7,557,614 - Bonsels , et al. July 7, 2
2009-07-07
Integrated Circuit for Writing and Reading Registers Distributed Across a Semiconductor Chip
App 20080270860 - Le; Thuyen ;   et al.
2008-10-30
Method for performing a test case with a LBIST engine on an integrated circuit, integrated circuit and method for specifying an integrated circuit
App 20080072111 - Le; Thuyen ;   et al.
2008-03-20

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