Owczarz; Aleksander

Patent Applications and Registrations

Patent applications and USPTO patent grants for Owczarz; Aleksander.The latest application filed is for "method and apparatus for wafer electroless plating".

Company Profile

0.53.26

Owczarz; Aleksander - San Jose CA
Owczarz, Aleksander - Fremont CA
Owczarz; Aleksander - Kalispell MT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for wafer electroless plating Grant 9,287,110 - Thie , et al. March 15, 2	2016-03-15
Controlled ambient system for interface engineering Grant 9,117,860 - Boyd , et al. August 25, 2	2015-08-25
Fluid handling system for wafer electroless plating and associated methods Grant 8,844,461 - Thie , et al. September 30, 2	2014-09-30
Method and Apparatus for Wafer Electroless Plating App 20130280917 - Thie; William ; et al.	2013-10-24
Method and apparatus for cleaning semiconductor wafers using compressed and/or pressurized foams, bubbles, and/or liquids Grant 8,535,451 - de Larios , et al. September 17, 2	2013-09-17
Method and apparatus for wafer electroless plating Grant 8,485,120 - Thie , et al. July 16, 2	2013-07-16
Wafer electroless plating system and associated methods Grant 8,314,027 - Thie , et al. November 20, 2	2012-11-20
Wafer Electroless Plating System and Associated Methods App 20120045897 - Thie; William ; et al.	2012-02-23
Wafer electroless plating system and associated methods Grant 8,069,813 - Thie , et al. December 6, 2	2011-12-06
Apparatus for Applying a Plating Solution for Electroless Deposition App 20100239767 - Dordi; Yezdi ; et al.	2010-09-23
Substrate gripper with integrated electrical contacts Grant 7,780,825 - Owczarz , et al. August 24, 2	2010-08-24
Apparatus for applying a plating solution for electroless deposition Grant 7,752,996 - Dordi , et al. July 13, 2	2010-07-13
Apparatuses and methods for cleaning a substrate Grant 7,625,452 - de Larios , et al. December 1, 2	2009-12-01
Method and apparatus for cleaning semiconductor wafers using compressed and/or pressurized foams, bubbles, and/or liquids Grant 7,568,490 - de Larios , et al. August 4, 2	2009-08-04
System, method and apparatus for in-situ substrate inspection Grant 7,542,134 - Owczarz , et al. June 2, 2	2009-06-02
Method and Apparatus for Cleaning Semiconductor Wafers Using Compressed and/or Pressurized Foams, Bubbles, and/or Liquids App 20090078282 - de Larios; John M. ; et al.	2009-03-26
Apparatuses And Methods For Cleaning A Substrate App 20090000044 - de Larios; John M. ; et al.	2009-01-01
Substrate Gripper With Integrated Electrical Contacts App 20080289967 - Owczarz; Aleksander ; et al.	2008-11-27
System, Method And Apparatus For In-situ Substrate Inspection App 20080273195 - Owczarz; Aleksander ; et al.	2008-11-06
Apparatuses and methods for cleaning a substrate Grant 7,441,299 - de Larios , et al. October 28, 2	2008-10-28
Method and Apparatus for Wafer Electroless Plating App 20080254225 - Thie; William ; et al.	2008-10-16
Fluid Handling System for Wafer Electroless Plating and Associated Methods App 20080251148 - Thie; William ; et al.	2008-10-16
Wafer Electroless Plating System and Associated Methods App 20080254621 - Thie; William ; et al.	2008-10-16
System, method and apparatus for in-situ substrate inspection Grant 7,397,555 - Owczarz , et al. July 8, 2	2008-07-08
Method and apparatus for real time metal film thickness measurement Grant 7,309,618 - Gotkis , et al. December 18, 2	2007-12-18
Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties Grant 7,205,166 - Gotkis , et al. April 17, 2	2007-04-17
Method and apparatus for cleaning a wafer bevel edge and notch using a pin and an abrasive film cassette Grant 7,179,154 - Boyd , et al. February 20, 2	2007-02-20
Semiconductor processing apparatus Grant 7,138,016 - Reardon , et al. November 21, 2	2006-11-21
Integration of sensor based metrology into semiconductor processing tools Grant 7,128,803 - Owczarz , et al. October 31, 2	2006-10-31
Process tape for cleaning or processing the edge of a semiconductor wafer Grant 7,115,023 - Owczarz October 3, 2	2006-10-03
Semiconductor processing apparatus Grant 7,094,291 - Reardon , et al. August 22, 2	2006-08-22
Enhancement of eddy current based measurement capabilities Grant 7,084,621 - Gotkis , et al. August 1, 2	2006-08-01
System, method and apparatus for in-situ substrate inspection App 20060139450 - Owczarz; Aleksander ; et al.	2006-06-29
Method and apparatus for aligning and setting the axis of rotation of spindles of a multi-body system Grant 7,025,854 - Boyd , et al. April 11, 2	2006-04-11
Method and apparatus of arrayed sensors for metrological control Grant 6,951,624 - Gotkis , et al. October 4, 2	2005-10-04
Apparatus and methods for detecting transitions of wafer surface properties in chemical mechanical polishing for process status and control Grant 6,937,915 - Kistler , et al. August 30, 2	2005-08-30
System and method for metal residue detection and mapping within a multi-step sequence Grant 6,929,531 - Gotkis , et al. August 16, 2	2005-08-16
Methods for detecting transitions of wafer surface properties in chemical mechanical polishing for process status and control Grant 6,925,348 - Kistler , et al. August 2, 2	2005-08-02
Complementary sensors metrological process and method and apparatus for implementing the same Grant 6,922,053 - Gotkis , et al. July 26, 2	2005-07-26
Apparatuses and methods for cleaning a substrate App 20050133061 - de Larios, John M. ; et al.	2005-06-23
Method and apparatus for cleaning semiconductor wafers using compressed and/or pressurized foams, bubbles, and/or liquids App 20050133060 - Larios, John M. de ; et al.	2005-06-23
Method and apparatus for metrological process control implementing complementary sensors Grant 6,894,491 - Gotkis , et al. May 17, 2	2005-05-17
Integration of sensor based metrology into semiconductor processing tools App 20050072528 - Owczarz, Aleksander ; et al.	2005-04-07
Method and apparatus for wafer mechanical stress monitoring and wafer thermal stress monitoring App 20050066739 - Gotkis, Yehiel ; et al.	2005-03-31
Methods for detecting transitions of wafer surface properties in chemical mechanical polishing for process status and control App 20050054268 - Kistler, Rodney ; et al.	2005-03-10
Complementary sensors metrological process and method and apparatus for implementing the same App 20050007107 - Gotkis, Yehiel ; et al.	2005-01-13
Method and apparatus of arrayed sensors for metrological control App 20050000653 - Gotkis, Yehiel ; et al.	2005-01-06
Method and apparatus of arrayed sensors for metrological control Grant 6,808,590 - Gotkis , et al. October 26, 2	2004-10-26
Apparatus for removal/remaining thickness profile manipulation Grant 6,808,442 - Wei , et al. October 26, 2	2004-10-26
Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties App 20040206455 - Gotkis, Yehiel ; et al.	2004-10-21
Chemical mechanical planarization (CMP) apparatus Grant 6,769,961 - Kistler , et al. August 3, 2	2004-08-03
Method And Apparatus For Metrological Process Control Implementing Complimentary Sensors App 20040119468 - Gotkis, Yehiel ; et al.	2004-06-24
Profiled retaining ring for chemical mechanical planarization Grant 6,716,299 - Gotkis , et al. April 6, 2	2004-04-06
System and method for metal residue detection and mapping within a multi-step sequence App 20040058620 - Gotkis, Yehiel ; et al.	2004-03-25
Enhancement of eddy current based measurement capabilities App 20040058545 - Gotkis, Yehiel ; et al.	2004-03-25
Method and apparatus for applying differential removal rates to a surface of a substrate App 20040011462 - Gotkis, Yehiel ; et al.	2004-01-22
Method and apparatus for real time metal film thickness measurement App 20040002171 - Gotkis, Yehiel ; et al.	2004-01-01
Method and apparatus for aligning and setting the axis of rotation of spindles of a multi-body system App 20030201067 - Boyd, John M. ; et al.	2003-10-30
Motor drive assembly for a semiconductor wafer processing system App 20020195132 - Owczarz, Aleksander	2002-12-26
Gas intake assembly for a wafer processing system Grant 6,105,592 - Thompson , et al. August 22, 2	2000-08-22
Semiconductor processor wafer holder Grant 5,431,421 - Thompson , et al. July 11, 1	1995-07-11
Semiconductor processor liquid spray system with additive blending Grant 5,409,310 - Owczarz April 25, 1	1995-04-25
Multi-station semiconductor processor with volatilization Grant 5,377,708 - Bergman , et al. January 3, 1	1995-01-03
Semiconductor processor apparatus with dynamic wafer vapor treatment and particulate volatilization Grant 5,235,995 - Bergman , et al. August 17, 1	1993-08-17
Robot loadable centrifugal semiconductor processor with extendible rotor Grant 5,232,328 - Owczarz , et al. August 3, 1	1993-08-03
Pneumatic bellows pump with supported bellows tube Grant 5,224,841 - Thompson , et al. July 6, 1	1993-07-06
Centrifugal wafer carrier cleaning apparatus Grant 5,224,503 - Thompson , et al. July 6, 1	1993-07-06
Single wafer processor with a frame Grant 5,222,310 - Thompson , et al. June 29, 1	1993-06-29
Semiconductor processor methods Grant 5,221,360 - Thompson , et al. June 22, 1	1993-06-22
Semiconductor processor with extendible receiver for handling multiple discrete wafers without wafer carriers Grant 5,174,045 - Thompson , et al. December 29, 1	1992-12-29
Single wafer processor apparatus Grant 5,168,887 - Thompson , et al. December 8, 1	1992-12-08
Semiconductor processor draining Grant 5,154,199 - Thompson , et al. October 13, 1	1992-10-13
Semiconductor processor gas-liquid separation Grant 5,095,927 - Thompson , et al. March 17, 1	1992-03-17
Low contamination blending and metering systems for semiconductor processing Grant 5,085,560 - Thompson , et al. February 4, 1	1992-02-04
Rinser dryer system Grant 5,022,419 - Thompson , et al. June 11, 1	1991-06-11

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