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Detection Of Defect In Edge Device Manufacturing By Artificial Intelligence App 20220091576 - Ouyang; Qiqing Christine ;   et al. | 2022-03-24 |
Classical artificial intelligence (AI) and probability based code infusion Grant 11,188,317 - Baughman , et al. November 30, 2 | 2021-11-30 |
Classical Artificial Intelligence (ai) And Probability Based Code Infusion App 20210286603 - Baughman; Aaron K. ;   et al. | 2021-09-16 |
Modeling Environment Noise For Training Neural Networks App 20210158143 - Baughman; Aaron K. ;   et al. | 2021-05-27 |
Personal Travel Health Vulnerability Navigator App 20170351831 - CAHAN; Amos ;   et al. | 2017-12-07 |
Personal Travel Health Vulnerability Navigator App 20170351833 - CAHAN; Amos ;   et al. | 2017-12-07 |
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Personal Travel Health Vulnerability Navigator App 20170351832 - CAHAN; Amos ;   et al. | 2017-12-07 |
Embedded Vertical Optical Grating For Heterogeneous Integration App 20120092771 - Liu; Fei ;   et al. | 2012-04-19 |
High speed lateral heterojunction MISFETs realized by 2-dimensional bandgap engineering and methods thereof Grant 7,902,012 - Ouyang , et al. March 8, 2 | 2011-03-08 |
FinFET with longitudinal stress in a channel Grant 7,872,303 - Chan , et al. January 18, 2 | 2011-01-18 |
High Speed Lateral Heterojunction Misfets Realized By 2-dimensional Bandgap Engineering And Methods Thereof App 20100159658 - Ouyang; Qiqing Christine ;   et al. | 2010-06-24 |
Ultra scalable high speed heterojunction vertical n-channel MISFETs and methods thereof Grant 7,679,121 - Ouyang , et al. March 16, 2 | 2010-03-16 |
Finfet With Longitudinal Stress In A Channel App 20100038679 - CHAN; KEVIN K. ;   et al. | 2010-02-18 |
High speed lateral heterojunction MISFETS realized by 2-dimensional bandgap engineering and methods thereof Grant 7,569,442 - Ouyang , et al. August 4, 2 | 2009-08-04 |
Strained MOS devices using source/drain epitaxy Grant 7,525,161 - Ieong , et al. April 28, 2 | 2009-04-28 |
Ultra scalable high speed heterojunction vertical n-channel MISFETs and methods thereof Grant 7,453,113 - Ouyang , et al. November 18, 2 | 2008-11-18 |
ULTRA SCALABLE HIGH SPEED HETEROJUNCTION VERTICAL n-CHANNEL MISFETS AND METHODS THEREOF App 20080237637 - Ouyang; Qiqing Christine ;   et al. | 2008-10-02 |
Strained MOS devices using source/drain epitaxy App 20080179627 - Ieong; Meikei ;   et al. | 2008-07-31 |
Ultra Scalable High Speed Heterojunction Vertical n-Channel Misfets and Methods Thereof App 20070241367 - Ouyang; Qiqing Christine ;   et al. | 2007-10-18 |
Ultra scalable high speed heterojunction vertical n-channel MISFETs and methods thereof Grant 7,205,604 - Ouyang , et al. April 17, 2 | 2007-04-17 |
High mobility heterojunction complementary field effect transistors and methods thereof App 20060128105 - Ouyang; Qiqing Christine ;   et al. | 2006-06-15 |
High mobility heterojunction complementary field effect transistors and methods thereof Grant 7,057,216 - Ouyang , et al. June 6, 2 | 2006-06-06 |
High speed lateral heterojunction MISFETS realized by 2-dimensional bandgap engineering and methods thereof App 20050239241 - Ouyang, Qiqing Christine ;   et al. | 2005-10-27 |
Low leakage heterojunction vertical transistors and high performance devices thereof Grant 6,943,407 - Ouyang , et al. September 13, 2 | 2005-09-13 |
High speed lateral heterojunction MISFETs realized by 2-dimensional bandgap engineering and methods thereof Grant 6,927,414 - Ouyang , et al. August 9, 2 | 2005-08-09 |
High mobility heterojunction complementary field effect transistors and methods thereof App 20050093021 - Ouyang, Qiqing Christine ;   et al. | 2005-05-05 |
High speed lateral heterojunction MISFETs realized by 2-dimensional bandgap engineering and methods thereof App 20040256614 - Ouyang, Qiqing Christine ;   et al. | 2004-12-23 |
Low leakage heterojunction vertical transistors and high performance devices thereof App 20040256639 - Ouyang, Qiqing Christine ;   et al. | 2004-12-23 |
Ultra scalable high speed heterojunction vertical n-channel MISFETs and methods thereof App 20040157353 - Ouyang, Qiqing Christine ;   et al. | 2004-08-12 |