| Patent | Date |
|---|
Method and apparatus for verifying memory testing software
Grant 8,595,557 - Jasinski , et al. November 26, 2 | 2013-11-26 |
Selectable repair pass masking
Grant 8,570,820 - Gorman , et al. October 29, 2 | 2013-10-29 |
Selectable Repair Pass Masking
App 20120230136 - Gorman; Kevin William ; et al. | 2012-09-13 |
Enabling memory redundancy during testing
Grant 7,930,592 - Ouellette , et al. April 19, 2 | 2011-04-19 |
Structure for increasing fuse programming yield
Grant 7,895,028 - Anand , et al. February 22, 2 | 2011-02-22 |
Partial good schema for integrated circuits having parallel execution units
Grant 7,739,637 - Goodnow , et al. June 15, 2 | 2010-06-15 |
Method and apparatus for self identification of circuitry
Grant 7,735,031 - Chickanosky , et al. June 8, 2 | 2010-06-08 |
System and method to optimize multi-core microprocessor performance using voltage offsets
Grant 7,721,119 - Capps, Jr. , et al. May 18, 2 | 2010-05-18 |
Structure for differential eFUSE sensing without reference fuses
Grant 7,688,654 - Anand , et al. March 30, 2 | 2010-03-30 |
Structure For Systems And Methods Of Managing A Set Of Programmable Fuses On An Integrated Circuit
App 20090256591 - Fifield; John Atkinson ; et al. | 2009-10-15 |
System and the methods of managing a set of programmable fuses on an integrated circuit
Grant 7,541,834 - Fifield , et al. June 2, 2 | 2009-06-02 |
Method And Apparatus For Self Identification Of Circuitry
App 20090052609 - Chickanosky; Valerie Hornbeck ; et al. | 2009-02-26 |
System and Method to Optimize Multi-Core Microprocessor Performance Using Voltage Offsets
App 20080052542 - Capps; Louis Bennie ; et al. | 2008-02-28 |
Enabling Memory Redundancy During Testing
App 20080022149 - Ouellette; Michael Richard ; et al. | 2008-01-24 |
Structure For Differential Efuse Sensing Without Reference Fuses
App 20080001251 - Anand; Darren Lane ; et al. | 2008-01-03 |
Method and apparatus for increasing fuse programming yield through preferred use of duplicate data
Grant 7,251,756 - Anand , et al. July 31, 2 | 2007-07-31 |
Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability
Grant 7,139,944 - Barbour , et al. November 21, 2 | 2006-11-21 |
Method And Apparatus For Increasing Fuse Programming Yield Through Preferred Use Of Duplicate Data
App 20060239088 - Anand; Darren Lane ; et al. | 2006-10-26 |
Method And Apparatus For Verifying Memory Testing Software
App 20060190788 - Jasinski; Eric ; et al. | 2006-08-24 |
Method For Separating Shift And Scan Paths On Scan-only, Single Port Lssd Latches
App 20050050415 - Anand, Darren Lane ; et al. | 2005-03-03 |
Method And System For Determining Minimum Post Production Test Time Required On An Integrated Circuit Device To Achieve Optimum Reliability
App 20050049810 - Barbour, Tange Nan ; et al. | 2005-03-03 |
Method For Reduced Electrical Fusing Time
App 20050013187 - Anand, Darren Lane ; et al. | 2005-01-20 |
Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox
Grant 6,577,156 - Anand , et al. June 10, 2 | 2003-06-10 |
Self-Test pattern to detect stuck open faults
Grant 6,442,085 - Fragano , et al. August 27, 2 | 2002-08-27 |
Method and apparatus for testing a write function of a dual-port static memory cell
App 20020110024 - Ouellette, Michael Richard ; et al. | 2002-08-15 |
Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox
App 20020101777 - Anand, Darren L. ; et al. | 2002-08-01 |
High density two port SRAM cell for low voltage CMOS applications
Grant 5,710,742 - Carter , et al. January 20, 1 | 1998-01-20 |
| 