Ouellette; Michael R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ouellette; Michael R..The latest application filed is for "built-in self-test (bist) engine configured to store a per pattern based fail status in a pattern mask register".

Company Profile

14.107.110

Ouellette; Michael R. - Westford VT
Ouellette; Michael R. - Wesford VT US
Ouellette; Michael R. - Essex Junction VT
Ouellette; Michael R - Westford VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 11,295,829 - Busi , et al. April 5, 2	2022-04-05
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 10,971,243 - Busi , et al. April 6, 2	2021-04-06
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 10,692,584 - Busi , et al.	2020-06-23
Method and system for enumerating digital circuits in a system-on-a-chip (SOC) Grant 10,628,375 - Chadwick, Jr. , et al.	2020-04-21
Method and system for enumerating digital circuits in a system-on-a-chip (SOC) Grant 10,628,376 - Chadwick, Jr. , et al.	2020-04-21
Arbitration for memory diagnostics Grant 10,622,090 - Busi , et al.	2020-04-14
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20200075119 - BUSI; Aravindan J. ; et al.	2020-03-05
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 10,553,302 - Busi , et al. Fe	2020-02-04
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20190378587 - BUSI; Aravindan J. ; et al.	2019-12-12
Memory built-in self-test (MBIST) test time reduction Grant 10,490,296 - Ouellette , et al. Nov	2019-11-26
Method And System For Enumerating Digital Circuits In A System-on-a-chip (soc) App 20190332571 - CHADWICK, JR.; Thomas B. ; et al.	2019-10-31
Method And System For Enumerating Digital Circuits In A System-on-a-chip (soc) App 20190332570 - CHADWICK, JR.; Thomas B. ; et al.	2019-10-31
Method and system for enumerating digital circuits in a system-on-a-chip (SOC) Grant 10,423,570 - Chadwick, Jr. , et al. Sept	2019-09-24
Method and system for enumerating digital circuits in a system-on-a-chip (SOC) Grant 10,394,752 - Chadwick, Jr. , et al. A	2019-08-27
Arbitration For Memory Diagnostics App 20190035486 - BUSI; Aravindan J. ; et al.	2019-01-31
Arbitration for memory diagnostics Grant 10,153,055 - Busi , et al. Dec	2018-12-11
Failure analysis and repair register sharing for memory BIST Grant 10,014,074 - Mondal , et al. July 3, 2	2018-07-03
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20180061509 - BUSI; Aravindan J. ; et al.	2018-03-01
Built-in Self-test (bist) Engine Configured To Store A Per Pattern Based Fail Status In A Pattern Mask Register App 20180053566 - BUSI; Aravindan J. ; et al.	2018-02-22
Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register Grant 9,881,694 - Busi , et al. January 30, 2	2018-01-30
Programmable counter to control memory built in self-test Grant 9,859,019 - Hanagandi , et al. January 2, 2	2018-01-02
Failure Analysis And Repair Register Sharing For Memory Bist App 20170309349 - MONDAL; Krishnendu ; et al.	2017-10-26
Built-in-self-test (BIST) test time reduction Grant 9,773,570 - Gorman , et al. September 26, 2	2017-09-26
Built-in self-test (BIST) circuit and associated BIST method for embedded memories Grant 9,761,329 - Busi , et al. September 12, 2	2017-09-12
Memory test with in-line error correction code logic to test memory data and test the error correction code logic surrounding the memories Grant 9,734,920 - Gorman , et al. August 15, 2	2017-08-15
Memory Built-in Self-test (mbist) Test Time Reduction App 20170229191 - Ouellette; Michael R. ; et al.	2017-08-10
Built-in self-test (BIST) circuit and associated BIST method for embedded memories Grant 9,715,942 - Busi , et al. July 25, 2	2017-07-25
Method And System For Enumerating Digital Circuits In A System-on-a-chip (soc) App 20170161225 - CHADWICK, JR.; Thomas B. ; et al.	2017-06-08
Method And System For Enumerating Digital Circuits In A System-on-a-chip (soc) App 20170161229 - CHADWICK, JR.; Thomas B. ; et al.	2017-06-08
Method and system for enumerating digital circuits in a system-on-a-chip (SOC) Grant 9,672,185 - Chadwick, Jr. , et al. June 6, 2	2017-06-06
Built-in Self-test (bist) Circuit And Associated Bist Method For Embedded Memories App 20170110205 - Busi; Aravindan J. ; et al.	2017-04-20
Built-in Self-test (bist) Engine App 20170018313 - BUSI; Aravindan J. ; et al.	2017-01-19
Built-in Self-test (bist) Circuit And Associated Bist Method For Embedded Memories App 20160365156 - Busi; Aravindan J. ; et al.	2016-12-15
Fast auto shift of failing memory diagnostics data using pattern detection Grant 9,514,844 - Busi , et al. December 6, 2	2016-12-06
Read only memory (ROM) with redundancy Grant 9,460,811 - Braceras , et al. October 4, 2	2016-10-04
Arbitration For Memory Diagnostics App 20160284426 - BUSI; Aravindan J. ; et al.	2016-09-29
Apparatus for capturing results of memory testing Grant 9,286,181 - Monroe , et al. March 15, 2	2016-03-15
Fast Auto Shift Of Failing Memory Diagnostics Data Using Pattern Detection App 20160064102 - BUSI; Aravindan J. ; et al.	2016-03-03
Memory Test With In-line Error Correction Code Logic App 20160019981 - GORMAN; Kevin W. ; et al.	2016-01-21
Memory test with in-line error correction code logic Grant 9,224,503 - Gorman , et al. December 29, 2	2015-12-29
Verifying partial good voltage island structures Grant 9,172,373 - Gorman , et al. October 27, 2	2015-10-27
Method And System For Enumerating Digital Circuits In A System-on-a-chip (soc) App 20150095541 - CHADWICK, Jr.; Thomas B. ; et al.	2015-04-02
Verifying Partial Good Voltage Island Structures App 20150070048 - GORMAN; Kevin W. ; et al.	2015-03-12
Apparatus For Capturing Results Of Memory Testing App 20150039950 - Monroe; Craig M. ; et al.	2015-02-05
Staggered start of BIST controllers and BIST engines Grant 8,935,586 - Chickanosky , et al. January 13, 2	2015-01-13
Bypass structure for a memory device and method to reduce unknown test values Grant 8,917,566 - Cummings , et al. December 23, 2	2014-12-23
Decreasing power supply demand during BIST initializations Grant 8,918,690 - Hanagandi , et al. December 23, 2	2014-12-23
System and method of reducing test time via address aware BIST circuitry Grant 8,914,688 - Belansek , et al. December 16, 2	2014-12-16
Read Only Memory (rom) With Redundancy App 20140351662 - BRACERAS; George M. ; et al.	2014-11-27
Read only memory (ROM) with redundancy Grant 8,839,054 - Braceras , et al. September 16, 2	2014-09-16
Built-in-self-test (bist) Test Time Reduction App 20140258797 - Gorman; Kevin W. ; et al.	2014-09-11
Security-enhanced radio frequency object locator system, method and program storage device Grant 8,823,491 - Luke , et al. September 2, 2	2014-09-02
Decreasing Power Supply Demand During Bist Initializations App 20140189448 - Hanagandi; Deepak I. ; et al.	2014-07-03
System And Method Of Reducing Test Time Via Address Aware Bist Circuitry App 20140149810 - Belansek; George M. ; et al.	2014-05-29
Memory Test With In-line Error Correction Code Logic App 20140143619 - GORMAN; Kevin W. ; et al.	2014-05-22
Staggered Start Of Bist Controllers And Bist Engines App 20140129888 - Chickanosky; Valerie H. ; et al.	2014-05-08
Interleaving of memory repair data compression and fuse programming operations in single fusebay architecture Grant 8,719,648 - Gorman , et al. May 6, 2	2014-05-06
Built-in-self-test (BIST) organizational file generation Grant 8,661,399 - Monroe , et al. February 25, 2	2014-02-25
Integrated circuit design method and system Grant 8,656,325 - Barwin , et al. February 18, 2	2014-02-18
Built-in-self-test (bist) Organizational File Generation App 20140040685 - Monroe; Craig M. ; et al.	2014-02-06
Circuit and method for efficient memory repair Grant 8,612,813 - Chickanosky , et al. December 17, 2	2013-12-17
Validating interconnections between logic blocks in a circuit description Grant 8,595,678 - Monroe , et al. November 26, 2	2013-11-26
Bypass Structure For A Memory Device And Method To Reduce Unknown Test Values App 20130272072 - Cummings; Aaron J. ; et al.	2013-10-17
Read Only Memory (rom) With Redundancy App 20130275821 - BRACERAS; George M. ; et al.	2013-10-17
Determining fusebay storage element usage Grant 8,537,627 - Ouellette , et al. September 17, 2	2013-09-17
Validating Interconnections Between Logic Blocks In A Circuit Description App 20130205268 - Monroe; Craig M. ; et al.	2013-08-08
Security-enhanced Radio Frequency Object Locator System, Method And Program Storage Device App 20130181838 - Luke; Shawn M. ; et al.	2013-07-18
Integrated Circuit Design Method And System App 20130185684 - Barwin; John E. ; et al.	2013-07-18
Fusebay controller structure, system, and method Grant 8,484,543 - Anand , et al. July 9, 2	2013-07-09
Selectable dynamic/static latch with embedded logic Grant 8,471,595 - Austin , et al. June 25, 2	2013-06-25
Structure and method for storing multiple repair pass data into a fusebay Grant 8,467,260 - Gorman , et al. June 18, 2	2013-06-18
Circuit And Method For Efficient Memory Repair App 20130139010 - CHICKANOSKY; Valerie H. ; et al.	2013-05-30
Determining Fusebay Storage Element Usage App 20130058176 - Ouellette; Michael R. ; et al.	2013-03-07
Circuit and method for efficient memory repair Grant 8,381,052 - Chickanosky , et al. February 19, 2	2013-02-19
Fusebay Controller Structure, System, And Method App 20130042166 - Anand; Darren L. ; et al.	2013-02-14
Structure And Method For Storing Multiple Repair Pass Data Into A Fusebay App 20130033951 - Gorman; Kevin W. ; et al.	2013-02-07
Interleaving Of Memory Repair Data Compression And Fuse Programming Operations In Single Fusebay Architecture App 20130031319 - Gorman; Kevin W. ; et al.	2013-01-31
Method and apparatus for a robust embedded interface Grant 8,239,715 - Eustis , et al. August 7, 2	2012-08-07
Method of designing multi-state restore circuitry for restoring state to a power managed functional block Grant 8,239,791 - Lichtensteiger , et al. August 7, 2	2012-08-07
Data structure for describing MBIST architecture Grant 8,239,818 - Monroe , et al. August 7, 2	2012-08-07
At-speed Scan Enable Switching Circuit App 20120176144 - Iyengar; Vikram ; et al.	2012-07-12
Circuit and method for asynchronous pipeline processing with variable request signal delay Grant 8,188,765 - Ouellette , et al. May 29, 2	2012-05-29
Circuit And Method For Asynchronous Pipeline Processing With Variable Request Signal Delay App 20120062300 - Ouellette; Michael R. ; et al.	2012-03-15
Automation of fuse compression for an ASIC design system Grant 8,024,626 - Adams , et al. September 20, 2	2011-09-20
Circuit And Method For Efficient Memory Repair App 20110113280 - CHICKANOSKY; Valerie H. ; et al.	2011-05-12
Design structure and apparatus for a robust embedded interface Grant 7,937,632 - Eustis , et al. May 3, 2	2011-05-03
Diagnostic method and apparatus for non-destructively observing latch data Grant 7,916,826 - Anand , et al. March 29, 2	2011-03-29
Diagnosable general purpose test registers scan chain design Grant 7,908,534 - Motika , et al. March 15, 2	2011-03-15
Method, Apparatus, And Design Structure For Built-in Self-test App 20110029827 - CHICKANOSKY; VALERIE H ; et al.	2011-02-03
Structure for system for and method of performing high speed memory diagnostics via built-in-self-test Grant 7,870,454 - Gorman , et al. January 11, 2	2011-01-11
Integrated circuit containing multi-state restore circuitry for restoring state to a power-managed functional block Grant 7,821,294 - Lichtensteiger , et al. October 26, 2	2010-10-26
Automatically extensible addressing for shared array built-in self-test (ABIST) circuitry Grant 7,757,141 - Chickanosky , et al. July 13, 2	2010-07-13
Enabling memory redundancy during testing Grant 7,725,780 - Ouellette , et al. May 25, 2	2010-05-25
Managing redundant memory in a voltage island Grant 7,710,800 - Linzer , et al. May 4, 2	2010-05-04
Integration of LBIST into array BISR flow Grant 7,702,975 - Gorman , et al. April 20, 2	2010-04-20
Automatic shutdown or throttling of a BIST state machine using thermal feedback Grant 7,689,887 - Gorman , et al. March 30, 2	2010-03-30
Structure And Apparatus For A Robust Embedded Interface App 20090319841 - Eustis; Steven M. ; et al.	2009-12-24
Method And Apparatus For A Robust Embedded Interface App 20090319818 - Eustis; Steven M. ; et al.	2009-12-24
Method Of Designing Multi-state Restore Circuitry For Restoring State To A Power-managed Functional Block App 20090307637 - Lichtensteiger; Susan K. ; et al.	2009-12-10
Integrated Circuit Containing Multi-state Restore Circuitry For Restoring State To A Power-managed Functional Block App 20090302889 - Lichtensteiger; Susan K. ; et al.	2009-12-10
System and method for performing high speed memory diagnostics via built-in-self-test Grant 7,607,060 - Gorman , et al. October 20, 2	2009-10-20
Integration Of Lbist Into Array Bisr Flow App 20090251169 - Gorman; Kevin W. ; et al.	2009-10-08
Integration Of Lbist Into Array Bisr Flow App 20090251978 - Gorman; Kevin W. ; et al.	2009-10-08
Automatically Extensible Addressing For Shared Array Built-in Self-test (abist) Circuitry App 20090249146 - CHICKANOSKY; Valerie H. ; et al.	2009-10-01
Diagnosable General Purpose Test Registers Scan Chain Design App 20090217116 - Motika; Franco ; et al.	2009-08-27
Diagnostic Method And Apparatus For Non-destructively Observing Latch Data App 20090180584 - Anand; Darren L. ; et al.	2009-07-16
Automatic Shutdown Or Throttling Of A Bist State Machine Using Thermal Feedback App 20090161722 - Gorman; Kevin W. ; et al.	2009-06-25
Managing Redundant Memory In A Voltage Island App 20090154269 - Linzer; Harry I. ; et al.	2009-06-18
Partial Good Schema For Integrated Circuits Having Parallel Execution Units App 20090144673 - Goodnow; Kenneth J. ; et al.	2009-06-04
Design Structure for an Integrated Circuit Having State-Saving Input-Output Circuitry and a Method of Testing Such an Integrated Circuit App 20090115447 - Anemikos; Theodoros E. ; et al.	2009-05-07
Partial good integrated circuit and method of testing same Grant 7,478,301 - Farnsworth, III , et al. January 13, 2	2009-01-13
System and method for differential eFUSE sensing without reference fuses Grant 7,477,555 - Anand , et al. January 13, 2	2009-01-13
Apparatus for testing a memory of an integrated circuit Grant 7,474,575 - Ouellette , et al. January 6, 2	2009-01-06
Automatic shutdown or throttling of a bist state machine using thermal feedback Grant 7,458,000 - Gorman , et al. November 25, 2	2008-11-25
Diagnostic method and apparatus for non-destructively observing latch data Grant 7,453,973 - Anand , et al. November 18, 2	2008-11-18
Memory array having a redundant memory element Grant 7,440,348 - Ouellette , et al. October 21, 2	2008-10-21
Compilable Memory Structure And Test Methodology For Both Asic And Foundry Test Environments App 20080256405 - Eustis; Steven M. ; et al.	2008-10-16
Partial good integrated circuit and method of testing same Grant 7,434,129 - Farnsworth, III , et al. October 7, 2	2008-10-07
Structure for System for and Method of Performing High Speed Memory Diagnostics Via Built-In-Self-Test App 20080222464 - Gorman; Kevin W. ; et al.	2008-09-11
Partial Good Integrated Circuit And Method Of Testing Same App 20080209289 - Farnsworth; Leonard O. ; et al.	2008-08-28
Method and apparatus for in-system redundant array repair on integrated circuits Grant 7,405,990 - Bright , et al. July 29, 2	2008-07-29
Compilable memory structure and test methodology for both ASIC and foundry test environments Grant 7,404,125 - Eustis , et al. July 22, 2	2008-07-22
Method and apparatus for in-system redundant array repair on integrated circuits Grant 7,397,709 - Bright , et al. July 8, 2	2008-07-08
Programmable Locking Mechanism For Secure Applications In An Integrated Circuit App 20080155151 - Fifield; John A. ; et al.	2008-06-26
Integrated Circuit Having State-Saving Input-Output Circuitry and a Method of Testing Such an Integrated Circuit App 20080129330 - Anemikos; Theodoros ; et al.	2008-06-05
Design Structure For Providing Optimal Field Programming Of Electronic Fuses App 20080104551 - OUELLETTE; Michael R. ; et al.	2008-05-01
Method Of Providing Optimal Field Programming Of Electronic Fuses App 20080101145 - Perry; Troy J. ; et al.	2008-05-01
System For And Method Of Performing High Speed Memory Diagnostics Via Built-in-self-test App 20080082883 - Gorman; Kevin W ; et al.	2008-04-03
Method And Apparatus For In-system Redundant Array Repair On Integrated Circuits App 20080080274 - Bright; Arthur A. ; et al.	2008-04-03
Memory Array For An Integrated Circuit App 20080037339 - Ouellette; Michael R. ; et al.	2008-02-14
Enabling Memory Redundancy During Testing App 20080037341 - Ouellette; Michael R. ; et al.	2008-02-14
Method And Apparatus For In-system Redundant Array Repair On Integrated Circuits App 20080037350 - Bright; Arthur A. ; et al.	2008-02-14
Apparatus For Testing A Memory Of An Integrated Circuit App 20080037340 - Ouellette; Michael R. ; et al.	2008-02-14
Partial Good Integrated Circuit And Method Of Testing Same App 20080010571 - Farnsworth; Leonard O. III ; et al.	2008-01-10
System And Method For Differential Efuse Sensing Without Reference Fuses App 20080002451 - Anand; Darren L. ; et al.	2008-01-03
Method and apparatus for in-system redundant array repair on integrated circuits Grant 7,310,278 - Bright , et al. December 18, 2	2007-12-18
Enabling memory redundancy during testing Grant 7,304,901 - Ouellette , et al. December 4, 2	2007-12-04
Partial good integrated circuit and method of testing same Grant 7,305,600 - Farnsworth, III , et al. December 4, 2	2007-12-04
Method And Apparatus For In-system Redundant Array Repair On Integrated Circuits App 20070258296 - Bright; Arthur A. ; et al.	2007-11-08
Automatic Shutdown Or Throttling Of A Bist State Machine Using Thermal Feedback App 20070230260 - Gorman; Kevin W. ; et al.	2007-10-04
Memory testing Grant 7,251,757 - Ouellette , et al. July 31, 2	2007-07-31
Method for separating shift and scan paths on scan-only, single port LSSD latches Grant 7,243,279 - Anand , et al. July 10, 2	2007-07-10
Method and apparatus for test and repair of marginally functional SRAM cells Grant 7,210,085 - Brennan , et al. April 24, 2	2007-04-24
Keyword-based Connectivity Verification App 20070061764 - Adams; Janice M. ; et al.	2007-03-15
Automation Of Fuse Compression For An Asic Design System App 20070047343 - Adams; Janice M. ; et al.	2007-03-01
Diagnostic Method and Apparatus For Non-Destructively Observing Latch Data App 20070033458 - Anand; Darren L. ; et al.	2007-02-08
Automation of fuse compression for an ASIC design system Grant 7,174,486 - Adams , et al. February 6, 2	2007-02-06
Electronic fuse blow mimic and methods for adjusting electronic fuse blow Grant 7,170,299 - Anand , et al. January 30, 2	2007-01-30
Diagnostic method and apparatus for non-destructively observing latch data Grant 7,145,977 - Anand , et al. December 5, 2	2006-12-05
Redundancy register architecture for soft-error tolerance and methods of making the same Grant 7,117,428 - Oppold , et al. October 3, 2	2006-10-03
Low voltage programmable eFuse with differential sensing scheme Grant 7,098,721 - Ouellette , et al. August 29, 2	2006-08-29
Compilable Memory Structure And Test Methodology For Both Asic And Foundry Test Environments App 20060176745 - Eustis; Steven M. ; et al.	2006-08-10
Method for reduced electrical fusing time Grant 7,089,136 - Anand , et al. August 8, 2	2006-08-08
Method and system for providing quality control on wafers running on a manufacturing line Grant 7,089,132 - Bickford , et al. August 8, 2	2006-08-08
Compilable address magnitude comparator for memory array self-testing Grant 7,073,112 - Chai , et al. July 4, 2	2006-07-04
Redundancy register architecture for soft-error tolerance and methods of making the same App 20060059393 - Oppold; Jeffrey H. ; et al.	2006-03-16
LOW VOLTAGE PROGRAMMABLE eFUSE WITH DIFFERENTIAL SENSING SCHEME App 20060044049 - Ouellette; Michael R. ; et al.	2006-03-02
Redundancy register architecture for soft-error tolerance and methods of making the same Grant 7,000,155 - Oppold , et al. February 14, 2	2006-02-14
Method, system and apparatus for aggregating failures across multiple memories and applying a common defect repair solution to all of the multiple memories Grant 6,993,692 - Ouellette , et al. January 31, 2	2006-01-31
Enabling Memory Redundancy During Testing App 20050270866 - Ouellette, Michael R. ; et al.	2005-12-08
Method And System For Providing Quality Control On Wafers Running On A Manufacturing Line App 20050267705 - Bickford, Jeanne P. ; et al.	2005-12-01
Random access memory having an adaptable latency Grant 6,961,276 - Atallah , et al. November 1, 2	2005-11-01
Variable column redundancy region boundaries in SRAM Grant 6,944,075 - Eustis , et al. September 13, 2	2005-09-13
Self-test architecture to implement data column redundancy in a RAM Grant 6,928,377 - Eustis , et al. August 9, 2	2005-08-09
Multiple on-chip test runs and repairs for memories Grant 6,922,649 - Mondal , et al. July 26, 2	2005-07-26
Method and apparatus of local word-line redundancy in CAM Grant 6,920,525 - Chadwick , et al. July 19, 2	2005-07-19
Method and apparatus for test and repair of marginally functional SRAM cells App 20050138496 - Brennan, Ciaran J. ; et al.	2005-06-23
Multiple On-chip Test Runs And Repairs For Memories App 20050138513 - Mondal, Krishnendu ; et al.	2005-06-23
Memory testing App 20050120284 - Ouellette, Michael R. ; et al.	2005-06-02
Random access memory having an adaptable latency App 20050063211 - Atallah, Francois Ibrahim ; et al.	2005-03-24
Self-test architecture to implement data column redundancy in a RAM App 20050055173 - Eustis, Steven M. ; et al.	2005-03-10
Partial good integrated circuit and method of testing same App 20050047224 - Farnsworth, Leonard O. III ; et al.	2005-03-03
Method and system for merging multiple fuse decompression serial bitstreams to support auxiliary fuseblow capability Grant 6,856,569 - Nelson , et al. February 15, 2	2005-02-15
Diagnostic Method And Apparatus For Non-destructively Observing Latch Data App 20050025277 - Anand, Darren L. ; et al.	2005-02-03
Method, System And Apparatus For Aggregating Failures Across Multiple Memories And Applying A Common Defect Repair Solution To All Of The Multiple Memories App 20040268198 - Ouellette, Michael R. ; et al.	2004-12-30
Redundancy Register Architecture For Soft-error Tolerance And Methods Of Making The Same App 20040210802 - Oppold, Jeffery H. ; et al.	2004-10-21
Automation of fuse compression for an asic design system App 20040153900 - Adams, Janice M. ; et al.	2004-08-05
Method of electrically blowing fuses under control of an on-chip tester interface apparatus Grant 6,768,694 - Anand , et al. July 27, 2	2004-07-27
Memory BIST and repair Grant 6,766,468 - Barth, Jr. , et al. July 20, 2	2004-07-20
Method and System For Merging Multiple Fuse Decompression Serial Bitstreams To Support Auxiliary Fuseblow Capability App 20040136257 - Nelson, Erik A. ; et al.	2004-07-15
Compilable address magnitude comparator for memory array self-testing App 20040071009 - Chai, Chiaming ; et al.	2004-04-15
Method Of Electrically Blowing Fuses Under Control Of An On-chip Tester Interface Apparatus App 20040066695 - Anand, Darren L. ; et al.	2004-04-08
Method and apparatus of local word-line redundancy in CAM App 20040015651 - Chadwick, Thomas B. ; et al.	2004-01-22
Compilable address magnitude comparator for memory array self-testing Grant 6,658,610 - Chai , et al. December 2, 2	2003-12-02
Self test method and device for dynamic voltage screen functionality improvement Grant 6,656,751 - Andersen , et al. December 2, 2	2003-12-02
Saving content addressable memory power through conditional comparisons App 20030112648 - Chadwick, Thomas B. ; et al.	2003-06-19
Self test method and device for dynamic voltage screen functionality improvement App 20030090295 - Andersen, John E. ; et al.	2003-05-15
Memory BIST and repair App 20030014686 - Barth, John E. JR. ; et al.	2003-01-16
Saving content addressable memory power through conditional comparisons App 20030002313 - Chadwick, Thomas B. ; et al.	2003-01-02
Method and apparatus for testing memory App 20020114202 - Adams, R. Dean ; et al.	2002-08-22
Method and apparatus for testing memory App 20020116673 - Adams, R. Dean ; et al.	2002-08-22
Bi-directional differential low power sense amp and memory system Grant 6,363,023 - Andersen , et al. March 26, 2	2002-03-26
Self-test method for testing read stability in a dual-port SRAM cell Grant 6,333,872 - Ouellette , et al. December 25, 2	2001-12-25
Bi-directional differential low power sense amp and memory system App 20010009526 - Andersen, John E. ; et al.	2001-07-26
Serial input shift register built-in self test circuit for embedded circuits Grant 5,825,785 - Barry , et al. October 20, 1	1998-10-20