Ouchi; Chidane

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ouchi; Chidane.The latest application filed is for "x-ray imaging apparatus".

Company Profile

0.30.27

Ouchi; Chidane - Utsunomiya-shi JP
Ouchi; Chidane - Utsunomiya N/A JP
Ouchi; Chidane - Tochigi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
X-ray Imaging Apparatus App 20150279497 - Den; Toru ; et al.	2015-10-01
X-ray imaging apparatus and wavefront measuring apparatus Grant 9,107,637 - Ouchi , et al. August 18, 2	2015-08-18
X-ray imaging apparatus Grant 9,066,704 - Den , et al. June 30, 2	2015-06-30
X-ray imaging apparatus Grant 9,063,055 - Ouchi June 23, 2	2015-06-23
X-ray imaging apparatus Grant 9,046,466 - Ouchi June 2, 2	2015-06-02
Absolute position measurement apparatus and method Grant 9,043,182 - Seo , et al. May 26, 2	2015-05-26
X-ray imaging apparatus Grant 8,995,613 - Ouchi March 31, 2	2015-03-31
X-ray Talbot Interferometer And X-ray Talbot Imaging System App 20140270060 - Date; Takashi ; et al.	2014-09-18
Imaging apparatus and imaging method Grant 8,559,594 - Ouchi , et al. October 15, 2	2013-10-15
X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program Grant 8,537,966 - Ouchi , et al. September 17, 2	2013-09-17
Talbot interferometer, its adjustment method, and measurement method Grant 8,520,217 - Naoi , et al. August 27, 2	2013-08-27
X-ray Imaging Apparatus, X-ray Imaging Method, And X-ray Imaging Program App 20130070893 - Ouchi; Chidane ; et al.	2013-03-21
X-ray Imaging Apparatus App 20130070895 - Ouchi; Chidane	2013-03-21
X-ray Imaging Apparatus App 20130034209 - Ouchi; Chidane	2013-02-07
Wavefront-aberration-measuring device and exposure apparatus Grant 8,351,050 - Ouchi January 8, 2	2013-01-08
X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program Grant 8,340,243 - Ouchi , et al. December 25, 2	2012-12-25
X-ray Imaging Apparatus And Wavefront Measuring Apparatus App 20120281217 - Ouchi; Chidane ; et al.	2012-11-08
X-ray Imaging Apparatus App 20120263274 - Ouchi; Chidane	2012-10-18
X-ray Imaging Apparatus App 20120236988 - Den; Toru ; et al.	2012-09-20
Wavefront aberration measuring method, mask, wavefront aberration measuring device, exposure apparatus, and device manufacturing method Grant 8,077,391 - Ouchi , et al. December 13, 2	2011-12-13
X-ray Imaging Apparatus, X-ray Imaging Method, And X-ray Imaging Program App 20110280368 - Ouchi; Chidane ; et al.	2011-11-17
X-ray imaging apparatus, X-ray imaging method, and X-ray imaging program Grant 8,009,797 - Ouchi , et al. August 30, 2	2011-08-30
Measuring apparatus, exposure apparatus and method, and device manufacturing method Grant 8,004,691 - Ouchi , et al. August 23, 2	2011-08-23
Imaging Apparatus And Imaging Method App 20110200168 - Ouchi; Chidane ; et al.	2011-08-18
Measurement apparatus, exposure apparatus having the same, and device manufacturing method Grant 7,952,726 - Kato , et al. May 31, 2	2011-05-31
X-ray Imaging Apparatus, X-ray Imaging Method, And X-ray Imaging Program App 20100290590 - Ouchi; Chidane ; et al.	2010-11-18
Talbot Interferometer, Its Adjustment Method, And Measurement Method App 20100271636 - Naoi; Toshiyuki ; et al.	2010-10-28
Absolute Position Measurement Apparatus And Method App 20100235137 - Seo; Yuzo ; et al.	2010-09-16
Measurement Apparatus, Exposure Apparatus Having The Same, And Device Manufacturing Method App 20100190115 - Kato; Seima ; et al.	2010-07-29
Wavefront-aberration-measuring Device And Exposure Apparatus App 20100177323 - Ouchi; Chidane	2010-07-15
Measuring Apparatus, Exposure Apparatus And Method, And Device Manufacturing Method App 20090290136 - Ouchi; Chidane ; et al.	2009-11-26
Exposure Apparatus And Device Manufacturing Method App 20090268188 - Kato; Seima ; et al.	2009-10-29
Wavefront Aberration Measuring Method, Mask, Wavefront Aberration Measuring Device, Exposure Apparatus, And Device Manufacturing Method App 20090213389 - Ouchi; Chidane ; et al.	2009-08-27
Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method Grant 7,253,907 - Ouchi August 7, 2	2007-08-07
Measuring device and measuring method Grant 7,106,452 - Ouchi September 12, 2	2006-09-12
Interference system and semiconductor exposure apparatus having the same Grant 6,961,132 - Ouchi November 1, 2	2005-11-01
Measuring method and apparatus using shearing interferometry, exposure method and apparatus using the same, and device manufacturing method App 20050117168 - Ouchi, Chidane	2005-06-02
Projection exposure apparatus and device manufacturing method that change a resonator length of a continuous emission excimer laser Grant 6,853,442 - Ouchi February 8, 2	2005-02-08
Exposure apparatus and device manufacturing method using the same Grant 6,774,982 - Ouchi August 10, 2	2004-08-10
Interference system and semiconductor exposure apparatus having the same App 20040085548 - Ouchi, Chidane	2004-05-06
Surface shape measuring apparatus and method Grant 6,721,056 - Nakauchi , et al. April 13, 2	2004-04-13
Interference system and semiconductor exposure apparatus having the same Grant 6,661,522 - Ouchi December 9, 2	2003-12-09
Projection exposure apparatus and device manufacturing method using the same App 20020131030 - Ouchi, Chidane	2002-09-19
Exposure apparatus and device manufacturing method using the same App 20020101892 - Ouchi, Chidane	2002-08-01
Measuring device and measuring method App 20020024673 - Ouchi, Chidane	2002-02-28
Interference system and semiconductor exposure apparatus having the same App 20020024005 - Ouchi, Chidane	2002-02-28
Exposure Apparatus And Device Manufacturing Method Using The Same App 20010046088 - SANO, NAOTO ; et al.	2001-11-29

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