Otten; Ronald Henricus Johannes

Patent Applications and Registrations

Patent applications and USPTO patent grants for Otten; Ronald Henricus Johannes.The latest application filed is for "metrology apparatus".

Company Profile

2.4.5

Otten; Ronald Henricus Johannes - Rosmalen NL
Otten; Ronald Henricus Johannes - Rosemalen NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Metrology apparatus Grant 11,300,889 - Van Dijk , et al. April 12, 2	2022-04-12
Methods of determining stress in a substrate, control system for controlling a lithographic process, lithographic apparatus and computer program product Grant 11,300,888 - Van Haren , et al. April 12, 2	2022-04-12
Methods and apparatus for use in a device manufacturing method Grant 11,226,567 - Van Haren , et al. January 18, 2	2022-01-18
Metrology Apparatus App 20210165335 - VAN DIJK; Leon Paul ; et al.	2021-06-03
Methods And Apparatus For Use In A Device Manufacturing Method App 20200218169 - VAN HAREN; Richard Johannes Franciscus ; et al.	2020-07-09
Methods Of Determining Stress In A Substrate, Control System For Controlling A Lithographic Process, Lithographic Apparatus And App 20200050117 - VAN HAREN; Richard Johannes Franciscus ; et al.	2020-02-13
Lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product Grant 10,545,410 - Cekli , et al. Ja	2020-01-28
Lithographic Apparatus, Device Manufacturing Method And Associated Data Processing Apparatus And Computer Program Product App 20190079411 - CEKLI; Hakki Ergun ; et al.	2019-03-14
Methods Of Determining A Mechanical Property Of A Layer Applied To A Substrate, Control System For A Lithographic Apparatus And Lithographic Apparatus App 20190041758 - VAN DIJK; Leon Paul ; et al.	2019-02-07

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